Y10S 977/874
Probe tip array
Y10S977/874 (Probe tip array) appears on 96 US grants and 32 published applications in this corpus.
Search patents in Y10S- Granted patents
- 96
- Published applications
- 32
- Assignees
- 45
- Inventors
- 149
- Latest grant
- 12 Nov 2019
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 1 | 0 |
| 1992 | 2 | 0 |
| 1993 | 6 | 0 |
| 1994 | 5 | 0 |
| 1995 | 8 | 0 |
| 1996 | 2 | 0 |
| 1997 | 5 | 0 |
| 1998 | 2 | 0 |
| 1999 | 7 | 0 |
| 2000 | 7 | 0 |
| 2001 | 9 | 2 |
| 2002 | 6 | 5 |
| 2003 | 10 | 6 |
| 2004 | 3 | 3 |
| 2005 | 7 | 5 |
| 2006 | 4 | 5 |
| 2007 | 2 | 1 |
| 2008 | 4 | 2 |
| 2009 | 2 | 0 |
| 2010 | 1 | 0 |
| 2011 | 0 | 1 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 1 | 1 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 2 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Polymer pen lithography12 Nov 2019US 10,474,029 B2Northwestern University
- Polymer pen lithography5 Mar 2019US 10,222,694 B2Northwestern University
- Polymer pen lithography21 Jun 2016US 9,372,397 B2Northwestern University
- Scanning probe microscope capable of measuring samples having overhang structure5 Jan 2010US 7,644,447 B2Park Systems Corp.
- Rotatable multi-cantilever scanning probe microscopy head6 Oct 2009US 7,597,717 B1The United States of America as represented by the Secretary of the Navy
- Polymer Pen Lithography29 Aug 2019US 2019/0265587 A1Northwestern University
- Polymer pen lithography8 Dec 2016US 2016/0357101 A1Northwestern University
- Polymer pen lithography9 Jun 2011US 2011/0132220 A1Northwestern University
- Caliper method, system, and apparatus3 Apr 2008US 2008/0078229 A1Xidex Corporation
- Scanning probe microscope capable of measuring samples having overhang structure3 Apr 2008US 2008/0078932 A1PSIA Corporation
Most cited
By later US patents
- Nanoelectrode arrays220US 6,123,819 AProtiveris, Inc. · 2000
- Imaging apparatus and method104US 5,047,633 AAmersham International plc · 1991
- Multiple local probe measuring device and method95US 6,798,226 B2Europaisches Laboratorium fur Molekularbiologie (EMBL) · 2004
- Method of making silicon quantum wires on a substrate88US 5,976,957 ASony Corporation · 1999
- Scanning probe microscope having a single viewing device for on-axis and oblique angle views87US 5,714,756 APark Scientific Instruments · 1998