Multiple local probe measuring device and method

A method of effecting local manipulations referring to a sample, comprising;

• providing at least two probes in a positional relation with respect to a sample or a reference surface,
• adjusting a respective manipulation condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes, and
• manipulating said sample by means of said at least one of the probes with reference to said measurements effected with respect to said at least one other of the probes,
• wherein at least one of the manipulation conditions is roughly adjusted on the basis of the measurement of at least one of the probes and is finely adjusted on the basis of the measurement of at least one other of the probes.

A method of effecting local measurements referring to a sample, comprising:

• providing at least two probes in a positional relation with respect to a sample or a reference surface,
• adjusting a respective measurement condition for at least one of the probes on the basis of measurement effected with respect to said at least one of the probes, and
• obtaining measurements for the resulting measurement condition for at least one of the other probes,
• wherein the measurements for said at least one of the probes are a function of the measurements for said at least one of the other probes.

A method of effecting local measurements referring to a sample, comprising:

• providing at least two probes in a positional relation with respect to a sample or a reference surface,
• adjusting a respective measurement condition for at least one of the probes on the basis of measurement effected with respect to at least one other of the probes, and
• effecting a measurement with respect said at least one of the probes with reference to said measurement effected with respect to said at least one other of the probes,
• wherein the respective measurement conditions are stabilized by a feedback control loop.

A method of effecting local measurements referring to a sample, comprising:

• providing at least two probes in a positional relation with respect to a sample or a reference surface,
• adjusting a respective measurement condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes, and
• effecting a measurement with respect said at least one of the probes with reference to said measurements effected with respect to said at least one other of the probes,
• wherein a distance between an interaction or measurement section of the probes in a height direction associated with said sample or reference surface is adjustable.

A method of effecting local measurements referring to a sample, comprising:

• providing at least two probes in a positional relation with respect to a sample or a reference surface,
• adjusting a respective measurement condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes, and
• effecting a measurement with respect said at least one of the probes with reference to said measurements effected with respect to said at least one other of the probes,
• wherein the said measurements effected with respect to at least one other of the probes are detected by a piezo-electric detection arrangement.

A method of effecting local manipulations referring to a sample, comprising:

• providing at least two probes in a positional relation with respect to a sample or a reference surface,
• adjusting a respective manipulation condition for at least one of the probes on the basis of measurements effected with respect to said at least one of the probes, and
• obtaining measurements for the resulting manipulation condition for at least one of the other probes,
• wherein the measurements for said at least one of the probes are a function of the measurements for said at least one of the other probes.

A method of effecting local manipulations referring to a sample, comprising;

• providing at least two probes in a positional relation with respect to a sample or a reference surface,
• adjusting a respective manipulation condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes, and
• manipulating said sample by means for said at least one of the probes with reference to said measurements effected with respect to said at least one other of the probes,
• wherein the respective measurement conditions are stabilized with by a feedback control loop.

A method of effecting local manipulations referring to a sample, comprising;

• providing at least to probes in a positional relation with respect to a sample or a reference surface,
• adjusting a respective manipulation condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes, and
• manipulating said sample by means for said at least one of the probes with reference to said measurements effected with respect to said at least one other of the probes,
• wherein a distance between an interaction or measurement section of the probes in a height direction associated with said sample or reference surface is adjustable.

A method of effecting local manipulations referring to a sample, comprising;

• providing at least two probes in a positional relation with respect to a sample or a reference surface,
• adjusting a respective manipulation condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes, and
• manipulating said sample by means for said at least one of the probes with reference to said measurements effected with respect to said at least one other of the probes,
• wherein the said measurements effected with respect to at least one other of the probes are detected by a piezo-electric detection arrangement.

A method of effecting local measurements referring to a sample, comprising:

• providing at least two probes in a positional relation with respect to a sample or a reference surface,
• adjusting a respective measurement condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes, and
• effecting a measurement with respect said at least one of the probes with reference to said measurement effected with respect to said at least one other of the probes
• wherein thermal position fluctuations of at least one of the probes are detected.

A method of effecting local measurements referring to a sample, comprising:

• providing a first probe and at least one other probe in a positional relation with respect to a sample,
• scanning in a first scan said first probe over said sample and acquiring topographic data by measuring the topography of said sample with said first probe,
• scanning in a second scan said at least one other probe over said sample,
• in the course of said second scan, adjusting a respective measurement condition for said at least one other probe on the basis of measurements effected during said second scan with respect to said first probe and on the basis of said topographic data, and
• in the course of said second scan, effecting measurements with respect to said at least one other probe with reference to said measurements effected with respect to said first probe.