Y10S 977/863
Atomic force probe
Y10S977/863 (Atomic force probe) appears on 140 US grants and 59 published applications in this corpus.
Search patents in Y10S- Granted patents
- 140
- Published applications
- 59
- Assignees
- 86
- Inventors
- 268
- Latest grant
- 1 Apr 2014
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1988 | 1 | 0 |
| 1989 | 3 | 0 |
| 1990 | 1 | 0 |
| 1991 | 2 | 0 |
| 1992 | 3 | 0 |
| 1993 | 6 | 0 |
| 1994 | 4 | 0 |
| 1995 | 7 | 0 |
| 1996 | 8 | 0 |
| 1997 | 4 | 0 |
| 1998 | 4 | 0 |
| 1999 | 7 | 0 |
| 2000 | 2 | 0 |
| 2001 | 11 | 1 |
| 2002 | 7 | 16 |
| 2003 | 19 | 11 |
| 2004 | 13 | 4 |
| 2005 | 3 | 8 |
| 2006 | 8 | 6 |
| 2007 | 3 | 4 |
| 2008 | 5 | 2 |
| 2009 | 5 | 3 |
| 2010 | 6 | 3 |
| 2011 | 4 | 0 |
| 2012 | 3 | 1 |
| 2013 | 0 | 0 |
| 2014 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Method of making thin film probe tip for atomic force microscopy1 Apr 2014US 8,689,361 B1Oicmicro, LLC
- Methods utilizing scanning probe microscope tips and products therefor or produced thereby21 Aug 2012US 8,247,032 B2Northwestern University
- Methods utilizing scanning probe microscope tips and products therefor or produced thereby24 Apr 2012US 8,163,345 B2Northwestern University
- Hybrid contact mode scanning cantilever system10 Apr 2012US 8,156,568 B2PicoCal, Inc.
- Atomic force microscope and interaction force measurement method using atomic force microscope5 Jul 2011US 7,975,316 B2Osaka University
- Methods utilizing scanning probe microscope tips and products therefor or produced thereby22 Nov 2012US 2012/0295029 A1Northwestern University
- Methods utilizing scanning probe microscope tips and products therefor or produced thereby22 Apr 2010US 2010/0098857 A1Northwestern University
- Atomic force microscope and interaction force measurement method using atomic force microscope18 Mar 2010US 2010/0071099 A1Osaka University
- Methods utilizing scanning probe microscope tips and products therefor or produced thereby18 Feb 2010US 2010/0040847 A1Northwestern University
- Cantilever device and cantilever controlling method26 Nov 2009US 2009/0293161 A1National Institute of Advanced Industrial Science and Technology
Most cited
By later US patents
- Atomic force microscope and method for imaging surfaces with atomic resolution171US 4,724,318 AInternational Business Machines Corporation · 1988
- Ultra-high density storage device149US 5,557,596 A1996
- Tapping atomic force microscope140US 5,412,980 ADigital Instruments, Inc. · 1995
- Near field scanning optical and force microscope including cantilever and optical waveguide136US 5,354,985 AStanford University · 1994
- Jumping probe microscope123US 5,266,801 ADigital Instruments, Inc. · 1993