H03M 1/108
Converters having special provisions for facilitating access for testing purposes
Official title: {Converters having special provisions for facilitating access for testing purposes}
H03M1/108 (Converters having special provisions for facilitating access for testing purposes) appears on 67 US grants and 42 published applications in this corpus.
Search patents in H03M- Granted patents
- 67
- Published applications
- 42
- Assignees
- 44
- Inventors
- 148
- Latest grant
- 10 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 1 | 0 |
| 1992 | 3 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 2 | 0 |
| 1998 | 2 | 0 |
| 1999 | 2 | 0 |
| 2000 | 1 | 0 |
| 2001 | 6 | 0 |
| 2002 | 3 | 5 |
| 2003 | 6 | 1 |
| 2004 | 1 | 3 |
| 2005 | 1 | 5 |
| 2006 | 5 | 2 |
| 2007 | 1 | 3 |
| 2008 | 4 | 2 |
| 2009 | 2 | 1 |
| 2010 | 2 | 3 |
| 2011 | 2 | 1 |
| 2012 | 1 | 1 |
| 2013 | 1 | 1 |
| 2014 | 0 | 1 |
| 2015 | 1 | 0 |
| 2016 | 0 | 0 |
| 2017 | 1 | 0 |
| 2018 | 2 | 1 |
| 2019 | 1 | 1 |
| 2020 | 1 | 3 |
| 2021 | 1 | 2 |
| 2022 | 2 | 1 |
| 2023 | 1 | 1 |
| 2024 | 4 | 3 |
| 2025 | 2 | 1 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Real-equivalent-time oscilloscope and wideband real-time spectrum analyzer10 Mar 2026US 12,574,039 B2Tektronix, Inc.
- Single event effect detection and circumvention in ADCs30 Sep 2025US 12,431,910 B2The Boeing Company
- Imaging system and imaging device29 Apr 2025US 12,289,550 B2Sony Semiconductor Solutions Corporation
- DFT architecture for analog circuits5 Nov 2024US 12,135,351 B2STMicroelectronics S,r.l.
- Testing of on-chip analog-mixed signal circuits using on-chip memory16 Apr 2024US 11,961,577 B2NXP USA, Inc.
- Single event effect detection and circumvention in adcs9 Jan 2025US 2025/0015809 A1The Boeing Company
- Real-equivalent-time oscilloscope and wideband real-time spectrum analyzer19 Sep 2024US 2024/0313795 A1Tektronix, Inc.
- Imaging system and imaging device9 May 2024US 2024/0155264 A1Sony Semiconductor Solutions Corporation
- Testing of on-chip analog-mixed signal circuits using on-chip memory11 Jan 2024US 2024/0013848 A1NXP USA, Inc.
- Dft architecture for analog circuits3 Aug 2023US 2023/0243886 A1STMicroelectronics S,r.l.
Most cited
By later US patents
- Built-in self test for analog to digital converters49US 5,132,685 AAT&T Bell Laboratories · 1992
- System and method for testing analog to digital converter embedded in microcontroller36US 5,063,383 ANational Semiconductor Corporation · 1991
- Self-test for charge redistribution analog-to-digital converter31US 6,268,813 B1Texas Instruments Incorporated · 2001
- Method and apparatus for testing an analog to digital converter24US 5,185,607 AMotorola, Inc. · 1993
- Dynamic element matching in A/D converters19US 6,816,103 B2Telefonaktiebolaget LM Ericsson (publ) · 2004