H01J 49/484
With spherical mirrors
Official title: {with spherical mirrors}
H01J49/484 (With spherical mirrors) appears on 27 US grants and 13 published applications in this corpus.
Search patents in H01J- Granted patents
- 27
- Published applications
- 13
- Assignees
- 19
- Inventors
- 41
- Latest grant
- 26 Mar 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 4 | 0 |
| 1990 | 2 | 0 |
| 1991 | 0 | 0 |
| 1992 | 2 | 0 |
| 1993 | 1 | 0 |
| 1994 | 2 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 1 |
| 2004 | 1 | 0 |
| 2005 | 0 | 1 |
| 2006 | 1 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 2 |
| 2012 | 0 | 0 |
| 2013 | 1 | 0 |
| 2014 | 0 | 2 |
| 2015 | 1 | 0 |
| 2016 | 1 | 1 |
| 2017 | 0 | 0 |
| 2018 | 1 | 1 |
| 2019 | 0 | 0 |
| 2020 | 0 | 1 |
| 2021 | 0 | 2 |
| 2022 | 2 | 1 |
| 2023 | 1 | 1 |
| 2024 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Aperture device and analyzer arrangement26 Mar 2024US 11,942,316 B2Scienta Omicron AB
- Analysis method and analysis apparatus11 Jul 2023US 11,698,336 B2JEOL Ltd.
- Input lens and electron spectrometer2 Aug 2022US 11,404,260 B2JEOL Ltd.
- Device and method for electron transfer from a sample to an energy analyzer and electron spectrometer device10 May 2022US 11,328,918 B2SPECS Surface Nano Analysis GmbH
- Analyser arrangement for particle spectrometer22 May 2018US 9,978,579 B2Scienta Omicron AB
- Electron Spectrometer and Analytical Method21 Dec 2023US 2023/0411113 A1JEOL Ltd.
- Aperture device and analyser arrangement20 Jan 2022US 2022/0020580 A1Scienta Omicron AB
- Analysis Method and Analysis Apparatus1 Apr 2021US 2021/0096063 A1JEOL Ltd.
- Input Lens and Electron Spectrometer1 Apr 2021US 2021/0098244 A1JEOL Ltd.
- Device and method for electron transfer from a sample to an energy analyzer and electron spectrometer device24 Sep 2020US 2020/0303177 A1SPECS Surface Nano Analysis GmbH
Most cited
By later US patents
- Energy filter for charged particle beam apparatus29US 5,126,565 AU. S. Philips Corporation · 1992
- Apparatus and method for surface analysis17US 5,665,967 AThermo Instrument Systems Inc. · 1997
- Charged particle spectrometers12US 4,358,680 AKratos LLC · 1982
- Photo ion spectrometer12US 4,889,987 AArch Development Corporation · 1989
- Charged particle energy analyzers11US 5,185,524 AKratos Analytical Limited · 1993