H01J 2237/24445
Using avalanche in a gas
Official title: using avalanche in a gas
H01J2237/24445 (Using avalanche in a gas) appears on 19 US grants and 18 published applications in this corpus.
Search patents in H01J- Granted patents
- 19
- Published applications
- 18
- Assignees
- 11
- Inventors
- 45
- Latest grant
- 9 May 2023
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 1 | 1 |
| 2003 | 0 | 0 |
| 2004 | 1 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 1 |
| 2009 | 0 | 2 |
| 2010 | 2 | 1 |
| 2011 | 0 | 0 |
| 2012 | 2 | 0 |
| 2013 | 0 | 1 |
| 2014 | 0 | 2 |
| 2015 | 3 | 1 |
| 2016 | 1 | 2 |
| 2017 | 1 | 1 |
| 2018 | 1 | 1 |
| 2019 | 2 | 0 |
| 2020 | 1 | 1 |
| 2021 | 0 | 3 |
| 2022 | 2 | 0 |
| 2023 | 1 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 0 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method for detector equalization during the imaging of objects with a multi-beam particle microscope9 May 2023US 11,645,740 B2Carl Zeiss MultiSEM GmbH
- Charged particle beam device31 May 2022US 11,348,757 B2Hitachi High-Tech Corporation
- Charged particle optical apparatus for through-the-lens detection of particles15 Mar 2022US 11,276,547 B2Carl Zeiss Microscopy GmbH
- Charged particle optical apparatus for through-the-lens detection of particles8 Dec 2020US 10,861,670 B2Carl Zeiss Microscopy GmbH
- Charged particle optical apparatus for through-the-lens detection of particles31 Dec 2019US 10,522,321 B2Carl Zeiss Microscopy GmbH
- Secondary electron detector using a conductive ultra-thin membrane provided in an atmospheric pressure electron microscope6 Aug 2026US 2026/0229450 A1Coxem Co., Ltd
- Charged Particle Beam Device2 Sep 2021US 2021/0272768 A1Hitachi High-Tech Corporation
- Method for detector equalization during the imgaging of objects with a multi-beam particle microscope24 Jun 2021US 2021/0192700 A1Carl Zeiss MultiSEM GmbH
- Charged particle optical apparatus for through-the-lens detection of particles18 Feb 2021US 2021/0050178 A1Carl Zeiss Microscopy GmbH
- Charged particle optical apparatus for through-the-lens detection of particles30 Apr 2020US 2020/0135425 A1Carl Zeiss Microscopy GmbH
Most cited
By later US patents
- Scanning electron microscope11US 6,365,898 B1LEO Electron Microscopy Limited · 2002
- Scanning electron microscope7US 7,755,045 B2Hitachi High-Technologies Corporation · 2010
- Charged particle optical apparatus for through-the lens detection of particles5US 10,068,744 B2Carl Zeiss Microscopy GmbH · 2018
- Multistage gas cascade amplifier3US 7,791,020 B2FEI Company · 2010
- Scanning transmission electron microscope using gas amplification3US 8,299,432 B2FEI Company · 2012