H01J 2201/30449
Metals and metal alloys
H01J2201/30449 (Metals and metal alloys) appears on 36 US grants and 36 published applications in this corpus.
Search patents in H01J- Granted patents
- 36
- Published applications
- 36
- Assignees
- 28
- Inventors
- 111
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2008 | 0 | 1 |
| 2009 | 1 | 2 |
| 2010 | 1 | 1 |
| 2011 | 1 | 0 |
| 2012 | 0 | 0 |
| 2013 | 1 | 1 |
| 2014 | 1 | 0 |
| 2015 | 1 | 4 |
| 2016 | 1 | 1 |
| 2017 | 2 | 0 |
| 2018 | 3 | 1 |
| 2019 | 2 | 8 |
| 2020 | 7 | 2 |
| 2021 | 4 | 5 |
| 2022 | 3 | 3 |
| 2023 | 3 | 1 |
| 2024 | 1 | 3 |
| 2025 | 3 | 1 |
| 2026 | 1 | 2 |
By publication year. 2026 runs to 8 Oct.
Recent patents
- Electron emission methods to generate electron beams with a narrow energy distribution25 Aug 2026US 12,719,005 B2The Regents of the University of California
- Cathode member for electron beam generation, and method for manufacturing the same7 Oct 2025US 12,437,953 B2Kobelco Research Institute, Inc.
- Field emission electron source, electron optical device, and manufacturing method26 Aug 2025US 12,400,820 B2Hitachi, Ltd.
- Electron emitter structure, external photoelectric effect emitter, particle collecting device, tunnel surface emitter, semiconductor- based direct emitter and liquid ioniser comprising same, gas sensor comprising an emitter or emitter structure, method for generating free electrons, and method for collecting particles8 Apr 2025US 12,272,513 B2DBT GmbH
- Emitter, electron gun in which same is used, electronic device in which same is used, and method for manufacturing same14 May 2024US 11,984,294 B2National Institute for Materials Science
- Backend field emission devices19 Mar 2026US 2026/0081089 A1
- Field emitter and method for manufacturing same15 Jan 2026US 2026/0018362 A1Suzhou Institute of Nano-Tech and Nano-Bionics (Sinano) , Chinese Academy of Sciences
- Field Emission Electron Source, Electron Optical Device, and Manufacturing Method29 May 2025US 2025/0174422 A1Hitachi, Ltd.
- Electron emitter structure, external photoelectric effect emitter, particle collecting device, tunnel surface emitter, semiconductor-based direct emitter and liquid ioniser comprising same, gas sensor comprising an emitter or emitter structure, method for generating free electrons, and method for collecting particles8 Aug 2024US 2024/0266134 A1DBT GmbH
- Electron emission methods to generate electron beams with a narrow energy distribution2 May 2024US 2024/0145204 A1The Regents of the University of California
Most cited
By later US patents
- Distributed, field emission-based X-ray source for phase contrast imaging28US 10,068,740 B2Massachusetts Institute of Technology · 2018
- Atomically sharp iridium tip10US 7,737,414 B2Academia Sinica · 2010
- Nanostructure field emission cathode structure and method for making6US 9,053,890 B2University Health Network · 2015
- Method for coded-source phase contrast X-ray imaging4US 10,045,752 B2Massachusetts Institute of Technology · 2018
- Electron beam device, cold field emitter, and method for regeneration of a cold field emitter4US 9,847,208 B1ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH · 2017