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US 12,719,005 B2Granted
Electron emission methods to generate electron beams with a narrow energy distribution
AssigneeThe Regents of the University of California
InventorsAlexander Stibor, Cameron Johnson
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Abstract
This disclosure provides systems, methods, and apparatus related to electron emission. A method includes providing a nanotip field emitter. The nanotip field emitter includes a nanoprotrusion at a tip of the nanotip field emitter. The nanotip field emitter is cooled to a temperature. The temperature is about 80 Kelvin or lower. An electric field is applied between an extraction electrode and the nanotip field emitter to induce emission of electrons from the nanotip field emitter.
Claims20
A method comprising:
- providing a nanotip field emitter, the nanotip field emitter including a nanoprotrusion at a tip of the nanotip field emitter;
- cooling the nanotip field emitter to a temperature, the temperature being about 80 Kelvin or lower;
- and
- applying an electric field between an extraction electrode and the nanotip field emitter to induce emission of electrons from the nanotip field emitter to generate an electron beam, an electron energy distribution full width half maximum of the electron beam being about 10 millielectron volts to 70 millielectron volts.
1 more element
An apparatus comprising:
- a vacuum chamber;
- a nanotip field emitter positioned within the vacuum chamber, a tip of the nanotip field emitter including a nanoprotrusion;
- an extraction electrode positioned within the vacuum chamber;
- a cooling apparatus, the cooling apparatus operable to cool the nanotip field emitter to about 80 Kelvin or lower;
- and
- a power source, the power source operable to apply an electric field between the extraction electrode and the nanotip field emitter to induce emission of electrons from the nanotip field emitter to generate an electron beam, an electron energy distribution full width half maximum of the electron beam being about 10 millielectron volts to 70 millielectron volts.
3 more elements
Dependencies are inferred from the claim text.