G05B 2219/32356
For diagnostics
G05B2219/32356 (For diagnostics) appears on 23 US grants and 31 published applications in this corpus.
Search patents in G05B- Granted patents
- 23
- Published applications
- 31
- Assignees
- 24
- Inventors
- 87
- Latest grant
- 16 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 1 |
| 2004 | 2 | 0 |
| 2005 | 0 | 1 |
| 2006 | 1 | 0 |
| 2007 | 0 | 1 |
| 2008 | 0 | 1 |
| 2009 | 1 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 1 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 1 |
| 2017 | 0 | 1 |
| 2018 | 1 | 2 |
| 2019 | 1 | 2 |
| 2020 | 1 | 3 |
| 2021 | 2 | 2 |
| 2022 | 4 | 5 |
| 2023 | 1 | 4 |
| 2024 | 2 | 4 |
| 2025 | 5 | 2 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Construction method of abnormality diagnosis model, abnormality diagnosis method, construction device of abnormality diagnosis model, and abnormality diagnosis device16 Jun 2026US 12,656,326 B2Jfe Steel Corporation
- Information processing apparatus, information processing system, and part ordering method26 Aug 2025US 12,400,191 B2Tokyo Electron Limited
- Method for creating amount of wear estimation model, method for estimating amount of wear, amount of wear estimation model creation apparatus, program for creating amount of wear estimation model, amount of wear estimation apparatus, and program for estimating amount of wear8 Jul 2025US 12,353,189 B2KYOCERA Corporation
- Distributed system and data transmission method24 Jun 2025US 12,339,641 B2Hitachi, Ltd.
- Methods and systems for component-based reduced order modeling for industrial-scale structural digital twins10 Jun 2025US 12,326,717 B2
- Systems and Methods for Controlling Chlorinators18 Dec 2025US 2025/0382811 A1Hayward Industries, Inc.
- Semiconductor manufacturing system, behavior recognition device and semiconductor manufacturing method12 Jun 2025US 2025/0189950 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Systems, apparatuses, methods, and computer program products for artificial intelligence and machine learning integration within a process simulation system17 Oct 2024US 2024/0346366 A1
- Methods and systems for component-based reduced order modeling for industrial-scale structural digital twins25 Apr 2024US 2024/0135064 A1Akselos S.A.
- Semiconductor manufacturing system, behavior recognition device and semiconductor manufacturing method21 Mar 2024US 2024/0094705 A1Taiwan Semiconductor Manufacturing Company.Ltd
Most cited
By later US patents
- Tool for configuring and managing a process control network including the use of spatial information37US 6,772,017 B1Fisher-Rosemount Systems, Inc. · 2004
- Methods and apparatus for the testing, monitoring and improvement of manufacturing process effectiveness18US 5,617,321 AComputer Sciences Corporation · 1997
- Tool for configuring and managing a process control network including the use of spatial information8US 7,010,362 B2Fisher-Rosemount Systems, Inc. · 2006
- Systems and methods for controlling chlorinators7US 9,885,193 B22018
- Real-time fault detection and classification system in use with a semiconductor fabrication process5US 7,640,070 B2Industrial Technology Research Institute · 2009