G05B 2219/32222
Fault, defect detection of origin of fault, defect of product
G05B2219/32222 (Fault, defect detection of origin of fault, defect of product) appears on 77 US grants and 107 published applications in this corpus.
Search patents in G05B- Granted patents
- 77
- Published applications
- 107
- Assignees
- 75
- Inventors
- 311
- Latest grant
- 27 Jan 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 1 | 0 |
| 2003 | 2 | 1 |
| 2004 | 4 | 2 |
| 2005 | 3 | 4 |
| 2006 | 3 | 4 |
| 2007 | 2 | 4 |
| 2008 | 2 | 4 |
| 2009 | 2 | 3 |
| 2010 | 3 | 0 |
| 2011 | 2 | 2 |
| 2012 | 1 | 2 |
| 2013 | 1 | 1 |
| 2014 | 0 | 0 |
| 2015 | 1 | 4 |
| 2016 | 1 | 2 |
| 2017 | 3 | 7 |
| 2018 | 4 | 3 |
| 2019 | 6 | 10 |
| 2020 | 5 | 9 |
| 2021 | 5 | 9 |
| 2022 | 7 | 7 |
| 2023 | 6 | 8 |
| 2024 | 6 | 12 |
| 2025 | 4 | 5 |
| 2026 | 2 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Methods and systems for performing root cause analysis with a trained machine learning model27 Jan 2026US 12,535,803 B2Robert Bosch GmbH
- Method for facilitating analysis of causes of machining defects20 Jan 2026US 12,528,146 B2Industrial Technology Research Institute
- Method of machining articles from a superhard disc18 Nov 2025US 12,474,685 B2Element Six Limited
- Method of setting factor variable area, and system23 Sep 2025US 12,422,821 B2Seiko Epson Corporation
- System and method for generating machine learning model with trace data20 May 2025US 12,306,607 B2Samsung Display Co., Ltd.
- System and Method for Adaptive Semiconductor Process Control17 Sep 2026US 2026/0277184 A1Qomplx LLC
- Systems and methods for deep learning-driven neurosymbolic techniques for correlation discovery, causal analysis, and prescriptive recommendations with knowledge-based reasoning27 Aug 2026US 2026/0252064 A1Arizona Board of Regents on behalf of Arizona State University
- Systems and methods for neurosymbolic root-cause analysis and ranked triage27 Aug 2026US 2026/0252845 A1Arizona Board of Regents on behalf of Arizona State University
- 3d print corrections using chemical precipitation reactions2 Jul 2026US 2026/0184020 A1International Business Machines Corporation
- Classifying product units18 Dec 2025US 2025/0383649 A1ASML Netherlands B. V.
Most cited
By later US patents
- Use of contamination-free manufacturing data in fault detection and classification as well as in run-to-run control35US 6,560,504 B1Advanced Micro Devices, Inc. · 2003
- Automatic process control of additive manufacturing device33US 9,855,698 B2Massachusetts Institute of Technology · 2018
- Integrated quality control method and system24US 5,245,554 AHitachi, Ltd. · 1993
- Determination of a process flow based upon fault detection analysis18US 6,740,534 B1Advanced Micro Devices, Inc. · 2004
- Dynamic inline yield analysis and prediction of a defect limited yield using inline inspection defects15US 7,937,179 B2APPLIED Materials.Inc. · 2011