G05B 2219/32174
Memory table parts classification and working, manufacturing conditions
G05B2219/32174 (Memory table parts classification and working, manufacturing conditions) appears on 9 US grants and 7 published applications in this corpus.
Search patents in G05B- Granted patents
- 9
- Published applications
- 7
- Assignees
- 10
- Inventors
- 27
- Latest grant
- 20 Jul 2021
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 1 |
| 2002 | 1 | 0 |
| 2003 | 1 | 1 |
| 2004 | 1 | 1 |
| 2005 | 0 | 0 |
| 2006 | 1 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 1 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 1 |
| 2019 | 1 | 1 |
| 2020 | 0 | 0 |
| 2021 | 1 | 0 |
| 2022 | 0 | 0 |
| 2023 | 0 | 0 |
| 2024 | 0 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Substrate processing method and substrate processing system20 Jul 2021US 11,069,548 B2Tokyo Electron Limited
- Substrate processing method and substrate processing system3 Sep 2019US 10,403,525 B2Tokyo Electron Limited
- Spatial coordinate-based method for identifying work pieces28 Feb 2006US 7,003,892 B2Hexagon Metrology, Inc.
- Method and system for on-line sheet metal nesting6 Jan 2004US 6,675,059 B2Delaware Capital Formation, Inc.
- Parametric programming of robots and automated machines for manufacturing electrical enclosures2 Dec 2003US 6,658,316 B1ABB Technology AG
- Instrument classification symbol specifying device8 Feb 2024US 2024/0045395 A1Kabushiki Kaisha Toshiba
- Substrate processing method and substrate processing system28 Nov 2019US 2019/0362996 A1Tokyo Electron Limited
- Substrate processing method and substrate processing system1 Mar 2018US 2018/0061692 A1Tokyo Electron Limited
- Semiconductor manufacturing apparatus4 Mar 2010US 2010/0057239 A1
- Spatial coordinate-based method for identifying work pieces21 Oct 2004US 2004/0210553 A1Hexagon Metrology, Inc.
Most cited
By later US patents
- Spatial coordinate-based method for identifying work pieces109US 7,003,892 B2Hexagon Metrology, Inc. · 2006
- Method and system of managing construction-related information and production-related information32US 5,806,069 AToyota Jidosha Kabushiki Kaisha · 1998
- Parametric programming of robots and automated machines for manufacturing electrical enclosures29US 6,658,316 B1ABB Technology AG · 2003
- Automatic soldering apparatus, apparatus and method for teaching same, soldering inspection apparatus and method, and apparatus and method for automatically correcting soldering22US 5,542,600 AOMRON Corporation · 1996
- Production system for garments or other products20US 5,233,534 AGerber Garment Technology, Inc. · 1993