G01R 29/0276
The pulse characteristic being rise time
Official title: {the pulse characteristic being rise time (measuring rate of change G01R19/12)}
G01R29/0276 (The pulse characteristic being rise time) appears on 25 US grants and 15 published applications in this corpus.
Search patents in G01R- Granted patents
- 25
- Published applications
- 15
- Assignees
- 19
- Inventors
- 46
- Latest grant
- 5 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 1 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 4 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 2 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 1 |
| 2004 | 0 | 0 |
| 2005 | 0 | 1 |
| 2006 | 1 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 1 |
| 2011 | 0 | 0 |
| 2012 | 0 | 1 |
| 2013 | 0 | 0 |
| 2014 | 1 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 1 |
| 2017 | 1 | 0 |
| 2018 | 1 | 4 |
| 2019 | 2 | 0 |
| 2020 | 1 | 0 |
| 2021 | 1 | 1 |
| 2022 | 1 | 0 |
| 2023 | 1 | 3 |
| 2024 | 2 | 1 |
| 2025 | 0 | 1 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Apparatus and methods for programming multiple parameters per pin of an integrated circuit5 May 2026US 12,619,808 B2Analog Devices, Inc.
- Component impedance measurement and characterization at high transient voltages27 Aug 2024US 12,072,362 B2Analog Devices, Inc.
- Jitter noise detector27 Aug 2024US 12,072,365 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Jitter noise detector7 Nov 2023US 11,808,798 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Jitter noise detector29 Nov 2022US 11,513,147 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Monitor for avionics can bus solutions2 Oct 2025US 2025/0306075 A1Rockwell Collins, Inc.
- Apparatus and methods for programming multiple parameters per pin of an integrated circuit23 May 2024US 2024/0169131 A1Analog Devices, Inc.
- Novel jitter noise detector14 Dec 2023US 2023/0400494 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Component impedance measurement and characterization at high transient voltages4 May 2023US 2023/0139107 A1Analog Devices, Inc.
- Novel jitter noise detector9 Feb 2023US 2023/0040034 A1Taiwan Semiconductor Manufacturing Company.Ltd
Most cited
By later US patents
- Ultra high resolution Josephson sampling technique26US 4,401,900 AInternational Business Machines Corporation · 1983
- Test method of A/D converter20US 4,795,963 AHitachi, Ltd. · 1989
- Timing signal generator15US 4,864,160 ASchlumberger Systems & Services, Inc. · 1989
- Adaptive fixed-threshold pulse time-of-arrival detection apparatus for precision distance measuring equipment applications15US 5,266,953 AAllied-Signal Inc. · 1993
- Ultra high resolution Josephson sampling technique14US 4,631,423 AInternational Business Machines Corporation · 1986