Test method of A/D converter
AssigneeHitachi, Ltd.
InventorsToshiaki Ueno, Fumio Ikeuchi, Fumihito Inoue
Life of this patent
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Abstract
In the A/D converter test method, the square wave pulse as the test signal is supplied to the A/D converter under test; said pulse is converted into the digital signal by said A/D converter; the waveform of said square wave pulse is reconstructed by converting the digital signal outputted from said A/D converter into the analog signal; the rise time of said A/D converter under test is measured from the reconstructed waveform of said square wave pulse; and the dynamic characteristics of said A/D converter is calculated from the measured rise time.
Claims9
A method of testing an A/D converter including the steps of generating a test signal, supplying the generated test signal to said A/D converter, converting said test signal into a digital signal by said A/D converter, and reconstructing the waveform of said test signal from the digital signal outputted from said A/D converter, said method comprising the steps of:
- generating a square wave pulse as said test signal, supplying said square wave pulse to said A/D converter, reconstructing the waveform of said square wave pulse from the digital signal generated from said A/D converter, measuring the rise time characteristic of said A/D converter from the reconstructed waveform of said square wave pulse, and determining the dynamic characteristics of said A/D converter from the measured rise time.
A method for testing an analog-to-digital converter comprising the steps of:
- generating and applying a pulse wave signal as a test signal and a clock signal as a conversion signal at said analog-to-digital converter, wherein said test signal and said clock signal being phase synchronized;
- converting said test signal by said analog-to-digital converter into corresponding digital data;
- latching said digital data at a sampling frequency which is a fraction of said conversion signal;
- converting said latched digital data into a reconstructed square wave pulse signal;
- and
- measuring the rise time characteristic of said analog-to-digital converter using the rise time of said reconstructed square wave pulse, and determining the dnyamic characteristic of said analog-to-digital converter based on the measured rise time.
A method of testing an analog-to-digital converter comprising the steps of:
- generating and applying a pulse wave signal as a test signal and a clock signal as a conversion signal at said analog-to-digital converter, wherein said test signal and said clock signal being phase synchronized;
- converting a plurality of samplings of said test signal period by said analog-to-digital converter into corresponding digital data synchronously with conversion clock signal frequency;
- storing said digital data into respective storage locations in a memory;
- reconstructing said digital data by a process of data rearrangement so that the reconstructed waveform is effected by rearranging the digital data stored corresponding to the number of samplings in said plurality of samplings;
- and
- measuring the rise time characteristic of said analog-to-digital converter using the rise time of said reconstructed square wave pulse, and determining the dynamic characteristics of said analog-to-digital converter based on the measured rise time.
Dependencies are inferred from the claim text.