G01R 15/243
Based on the kerr effect, i.e. quadratic electro-optic effect
Official title: {based on the Kerr effect, i.e. quadratic electro-optic effect}
G01R15/243 (Based on the kerr effect, i.e. quadratic electro-optic effect) appears on 6 US grants and 6 published applications in this corpus.
Search patents in G01R- Granted patents
- 6
- Published applications
- 6
- Assignees
- 7
- Inventors
- 8
- Latest grant
- 1 Feb 2022
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| Year | Granted patents | Published applications |
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| 1976 | 1 | 0 |
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| 2004 | 1 | 1 |
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| 2013 | 0 | 1 |
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| 2019 | 0 | 1 |
| 2020 | 0 | 0 |
| 2021 | 1 | 1 |
| 2022 | 1 | 0 |
| 2023 | 0 | 0 |
| 2024 | 0 | 0 |
| 2025 | 0 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Magnetic property measuring systems, methods of measuring magnetic property, and methods of fabricating magnetic memory devices using the same1 Feb 2022US 11,237,224 B2Samsung Electronics Co., Ltd.
- Systems, methods, and devices for detecting magneto-optic Kerr effect16 Mar 2021US 10,948,733 B2The Regents of the University of California
- Conductor to which current detection head is fixed, and current detection head used in manufacture of same3 Feb 2015US 8,947,072 B2Toyota Jidosha Kabushiki Kaisha
- Current measurement technique and current measurement apparatus3 Jul 2007US 7,239,124 B2Hitachi Global Storage Technologies Japan, Ltd.
- Current measurement technique and current measurement apparatus21 Dec 2004US 6,833,694 B2Hitachi, Ltd.
- All Fiber Electro-Optical Voltage Sensor for Electrical Switchgear12 Jun 2025US 2025/0189564 A1OpticAmpere LLC
- Magnetic property measuring systems, methods of measuring magnetic property, and methods of fabricating magnetic memory devices using the same8 Apr 2021US 2021/0103011 A1Samsung Electronics Co., Ltd.
- Systems, methods, and devices for detecting magneto-optic kerr effect14 Nov 2019US 2019/0346267 A1The Regents of the University of California
- Conductor to which current detection head is fixed, and current detection head used in manufacture of same14 Mar 2013US 2013/0063128 A1Toyota Jidosha Kabushiki Kaisha
- Current measurement technique and current measurement apparatus13 Jan 2005US 2005/0007093 A1Hitachi Global Storage Technologies Japan, Ltd.
Most cited
By later US patents
- Voltage measuring device for an encapsulated high-voltage switching installation14US 3,939,412 ASiemens Aktiengesellschaft · 1976
- Current measurement technique and current measurement apparatus12US 6,833,694 B2Hitachi, Ltd. · 2004
- Magnetic property measuring systems, methods of measuring magnetic property, and methods of fabricating magnetic memory devices using the same1US 11,237,224 B2Samsung Electronics Co., Ltd. · 2022