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US 6,833,694 B2Granted
Current measurement technique and current measurement apparatus
AssigneeHitachi, Ltd.
InventorHiroshi Ikekame
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AssigneeHitachi, Ltd.
InventorHiroshi Ikekame
Estimating the term…
The object of the invention is to provide technique and an apparatus for precisely measuring high frequency current that flows in a transmission line of a small impedance load circuit. A current waveform can be measured in wide bandwidth (at high-time resolution) and at high sensitivity without processing DUT (nondestructive) and without having an effect of the impedance of the apparatus (noninvasive) by installing a magnetooptical device in a magnetic field generated based upon current that flows in the transmission line, applying a bias magnetic field to the magnetooptical device by a magnetic field generator, making polarized light incident under the control of a position so that detection sensitivity is maximum and detecting the variation of polarization included in reflected light from the magnetooptical device.
A current measurement apparatus of current that flows in a transmission line of an electric circuit, comprising:
A current measurement apparatus for measuring current that flows in transmission lines of an electric circuit provided with a first transmission line to be an approach route of the flow of the current and a second transmission line to be a return route of the flow of the current, comprising:
Dependencies are inferred from the claim text.