G01R 1/16
Magnets
G01R1/16 (Magnets) appears on 26 US grants and 27 published applications in this corpus.
Search patents in G01R- Granted patents
- 26
- Published applications
- 27
- Assignees
- 26
- Inventors
- 67
- Latest grant
- 1 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 1 | 0 |
| 1978 | 2 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 1 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 1 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 1 | 1 |
| 2015 | 0 | 0 |
| 2016 | 0 | 1 |
| 2017 | 0 | 1 |
| 2018 | 1 | 1 |
| 2019 | 0 | 2 |
| 2020 | 2 | 6 |
| 2021 | 3 | 2 |
| 2022 | 2 | 3 |
| 2023 | 3 | 2 |
| 2024 | 1 | 1 |
| 2025 | 2 | 5 |
| 2026 | 3 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Wafer test cassette, wafer test system and wafer test method1 Sep 2026US 12,724,064 B2Xingr Technologies (Zhejiang) Limited
- Method of having good thermal isolation in wafer test cassette26 May 2026US 12,638,497 B2Xingr Technologies (Zhejiang) Limited
- Wafer testing cassette24 Mar 2026US 12,584,957 B2Xingr Technologies (Zhejiang) Limited
- Probe unit and holder for a probe unit19 Aug 2025US 12,392,799 B2Carl Mahr Holding GmbH
- Semiconductor wafer testing system and related method for improving external magnetic field wafer testing28 Jan 2025US 12,210,055 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Test contact, table device, test contact holding device, and method for receiving a test contact in a simplified manner with an active pre-alignment process using electromagnetic manipulation5 Feb 2026US 2026/0036607 A1Pac Tech - Packaging Technology GmbH
- Wafer testing cassette20 Mar 2025US 2025/0093386 A1Xingr Technologies (Zhejiang) Limited
- Wafer test system20 Mar 2025US 2025/0093387 A1Xingr Technologies (Zhejiang) Limited
- Wafer test cassette, wafer test system and wafer test method20 Mar 2025US 2025/0093406 A1Xingr Technologies (Zhejiang) Limited
- Method of having good thermal isolation in wafer test cassette20 Mar 2025US 2025/0093407 A1Xingr Technologies (Zhejiang) Limited
Most cited
By later US patents
- Magnetic field concentration means and method for an implanted device83US 4,340,038 APacesetter Systems, Inc. · 1982
- Apparatus for providing a displacement representative of the magnitude of a signal31US 4,044,305 AThe Charles Stark Draper Laboratory, Inc. · 1977
- Panel mounting for electrical device13US 4,080,570 ASangamo Weston, Inc. · 1978
- Magnetically coupled electrical test lead10US 7,298,136 B12007
- Panel meter with adapter cover6US 3,997,840 AWeston Instruments, Inc. · 1976