Wafer test system
AssigneeXingr Technologies (Zhejiang) Limited
InventorsCHOON LEONG LOU, HO YEH CHEN
Life of this patent
Estimating the term…
Abstract
A wafer test system is provided. The wafer test system includes a wafer test cassette, a carrier, and a test equipment. The wafer test cassette includes a first magnetic member. The carrier includes a second magnetic member. The wafer test cassette is fixed on the carrier through magnetic attraction generated between the first magnetic member and the second magnetic member. The test equipment includes a tester and a test cabinet. The test cabinet has a plurality of test spaces used to accommodate the wafer test cassettes and the carriers, and the tester is electrically connected to the wafer test cassette.
Claims16
A wafer test system, comprising:
- a wafer test cassette including a first magnetic member and at least one first electrical contact;
- and
- a test equipment including:
- a tester;
- and
- at least one test cabinet including:
- a plurality of test spaces;
- a plurality of second electrical contacts;
- and
- a plurality of carriers each including a second magnetic member, the carrier being arranged in a test position of the test space;
- wherein the test space is used to accommodate the wafer test cassette;
- wherein the second electrical contact is configured to be electrically connected to the first electrical contact, so that the tester is electrically connected to the wafer test cassette;
- wherein the wafer test cassette is fixed to the carrier through magnetic attraction generated between the first magnetic member and the second magnetic member.
A wafer test system, comprising:
- a wafer test cassette including a first magnetic member and at least one first electrical contact;
- and
- a test equipment including:
- a tester;
- and
- at least one test cabinet each including a plurality of test spaces and a plurality of second electrical contacts;
- wherein the test space is used to accommodate the wafer test cassette, and the test space is defined by a top plate, a bottom plate, and a side wall;
- wherein a second magnetic member is disposed in the test space, the second magnetic member is disposed on the bottom plate or the side wall, and the wafer test cassette is fixed in the test space through magnetic attraction generated between the first magnetic member and the second magnetic member;
- and
- wherein the second electrical contact of the test cabinet is configured to be electrical connected to the first electrical contact, so that the wafer test cassette is electrical connected to the tester.
Dependencies are inferred from the claim text.