G01N 23/223
By irradiating the sample with x-rays or gamma-rays and by measuring x-ray
Official title: by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01N23/223 (By irradiating the sample with x-rays or gamma-rays and by measuring x-ray) appears on 1,172 US grants and 1,179 published applications in this corpus.
Search patents in G01N- Granted patents
- 1,172
- Published applications
- 1,179
- Assignees
- 605
- Inventors
- 2,340
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 13 | 0 |
| 1977 | 5 | 0 |
| 1978 | 7 | 0 |
| 1979 | 6 | 0 |
| 1980 | 3 | 0 |
| 1981 | 4 | 0 |
| 1982 | 9 | 0 |
| 1983 | 7 | 0 |
| 1984 | 7 | 0 |
| 1985 | 8 | 0 |
| 1986 | 7 | 0 |
| 1987 | 10 | 0 |
| 1988 | 3 | 0 |
| 1989 | 7 | 0 |
| 1990 | 6 | 0 |
| 1991 | 7 | 0 |
| 1992 | 7 | 0 |
| 1993 | 7 | 0 |
| 1994 | 6 | 0 |
| 1995 | 10 | 0 |
| 1996 | 8 | 0 |
| 1997 | 7 | 0 |
| 1998 | 10 | 0 |
| 1999 | 6 | 0 |
| 2000 | 18 | 0 |
| 2001 | 16 | 6 |
| 2002 | 33 | 25 |
| 2003 | 26 | 29 |
| 2004 | 19 | 23 |
| 2005 | 22 | 29 |
| 2006 | 18 | 31 |
| 2007 | 23 | 23 |
| 2008 | 29 | 47 |
| 2009 | 36 | 49 |
| 2010 | 36 | 23 |
| 2011 | 32 | 26 |
| 2012 | 14 | 24 |
| 2013 | 29 | 41 |
| 2014 | 23 | 44 |
| 2015 | 32 | 62 |
| 2016 | 39 | 58 |
| 2017 | 64 | 81 |
| 2018 | 52 | 45 |
| 2019 | 50 | 69 |
| 2020 | 59 | 59 |
| 2021 | 68 | 65 |
| 2022 | 51 | 73 |
| 2023 | 59 | 68 |
| 2024 | 55 | 65 |
| 2025 | 59 | 71 |
| 2026 | 40 | 43 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- System and method for approximating X-ray intensities for a sample measured by an X-ray detection system6 Oct 2026US 12,754,151 B2Bruker AXS GmbH
- Method and system for determining physical properties of rocky formations6 Oct 2026US 12,754,153 B2Geolog S.r.l.
- XRF analyzer with improved resolution by using micro-reset6 Oct 2026US 12,754,329 B2Evident Scientific, Inc.
- Fast nondestructive method to evaluate the curative system of rubber goods29 Sep 2026US 12,748,062 B2Beijing Huamei, Inc.
- Patterned X-ray emitting target29 Sep 2026US 12,749,642 B2Nova Measuring Instruments Ltd.
- Systems And Method for Interpreting High Energy Interactions8 Oct 2026US 2026/0309654 A1Decision Tree, LLC
- Hybrid x-ray and optical metrology and navigation24 Sep 2026US 2026/0287527 A1Tokyo Electron Limited
- High and low frequency soil and plant analysis systems with integrated measurements17 Sep 2026US 2026/0271821 A1Precision Planting LLC
- Marking of hydrocarbon products17 Sep 2026US 2026/0275212 A1Sicpa Holding SA
- X-ray fluorescence spectrometer, information storage medium, and program10 Sep 2026US 2026/0266747 A1Rigaku Corporation
Most cited
By later US patents
- Dynamic radiation therapy simulation system114US 7,349,522 B2Board of Trustees of the University of Arkansas · 2008
- Mobile miniature X-ray source98US 6,661,876 B2Moxtek, Inc. · 2003
- Method and apparatus for the detection of light elements on the surface of a semiconductor substrate using x-ray fluorescence (XRF)97US 5,778,039 AAdvanced Micro Devices, Inc. · 1998
- Apparatus and method for determining the elemental compositions and relative locations of particles on the surface of a semiconductor wafer96US 5,742,658 AAdvanced Micro Devices, Inc. · 1998
- X-ray fluorescence combined with laser induced photon spectroscopy93US 6,801,595 B2Niton Corporation · 2004