G01N 23/085
X-ray absorption fine structure [xafs]
Official title: X-ray absorption fine structure [XAFS], e.g. extended XAFS [EXAFS]
G01N23/085 (X-ray absorption fine structure [xafs]) appears on 43 US grants and 39 published applications in this corpus.
Search patents in G01N- Granted patents
- 43
- Published applications
- 39
- Assignees
- 30
- Inventors
- 85
- Latest grant
- 10 Feb 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 1 | 0 |
| 2002 | 1 | 0 |
| 2003 | 1 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 2 |
| 2012 | 0 | 0 |
| 2013 | 1 | 2 |
| 2014 | 2 | 4 |
| 2015 | 1 | 3 |
| 2016 | 4 | 4 |
| 2017 | 5 | 3 |
| 2018 | 5 | 4 |
| 2019 | 4 | 4 |
| 2020 | 4 | 1 |
| 2021 | 1 | 1 |
| 2022 | 3 | 5 |
| 2023 | 1 | 2 |
| 2024 | 1 | 1 |
| 2025 | 2 | 2 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method for estimating abrasion resistance10 Feb 2026US 12,546,730 B2Sumitomo Rubber Industries, Ltd.
- System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes30 Sep 2025US 12,429,437 B2Sigray, Inc.
- Spectrometer25 Feb 2025US 12,235,228 B2EasyXAFS, LLC
- X-ray sequential array wavelength dispersive spectrometer30 Jan 2024US 11,885,755 B2Sigray, Inc.
- Lubricant and lubrication composition8 Aug 2023US 11,718,809 B2DIC Corporation
- Method for estimating abrasion resistance4 Jun 2026US 2026/0153456 A1Sumitomo Rubber Industries, Ltd.
- Spectrometer22 May 2025US 2025/0164421 A1EasyXAFS, LLC
- System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes8 May 2025US 2025/0146960 A1Sigray, Inc.
- Sic crystal substrate, method of manufacturing sic crystal substrate, sic epitaxial substrate, and method of manufacturing sic epitaxial substrate21 Nov 2024US 2024/0387640 A1Sumitomo Electric Industries, Ltd.
- X-ray sequential array wavelength dispersive spectrometer2 Nov 2023US 2023/0349842 A1Sigray, Inc.
Most cited
By later US patents
- X-ray surface analysis and measurement apparatus66US 9,594,036 B2Sigray, Inc. · 2017
- High brightness X-ray absorption spectroscopy system56US 9,448,190 B2Sigray, Inc. · 2016
- Method for identification of unknown substances43US 6,140,643 AExxonMobil Upstream Research Company · 2000
- Method of performing X-ray spectroscopy and X-ray absorption spectrometer system34US 10,416,099 B2Sigray, Inc. · 2019
- EXAFS spectrometer30US 4,642,811 ANorthwestern University · 1987