G01N 2223/607
Strain
Official title: strain
G01N2223/607 (Strain) appears on 53 US grants and 59 published applications in this corpus.
Search patents in G01N- Granted patents
- 53
- Published applications
- 59
- Assignees
- 51
- Inventors
- 152
- Latest grant
- 16 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 0 | 0 |
| 2009 | 1 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 1 |
| 2013 | 0 | 3 |
| 2014 | 2 | 5 |
| 2015 | 4 | 0 |
| 2016 | 0 | 4 |
| 2017 | 2 | 3 |
| 2018 | 6 | 5 |
| 2019 | 3 | 4 |
| 2020 | 6 | 7 |
| 2021 | 3 | 8 |
| 2022 | 7 | 10 |
| 2023 | 4 | 4 |
| 2024 | 6 | 2 |
| 2025 | 4 | 2 |
| 2026 | 2 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- X-ray diffraction method for the analysis of amorphous and semi-crystalline materials16 Jun 2026US 12,656,278 B2Danmarks Tekniske Universitet
- Blanker-enhanced moire imaging26 May 2026US 12,640,332 B2FEI Company
- Method for manufacturing reference piece for x-ray measurement of residual stress and reference piece for x-ray measurement of residual stress25 Nov 2025US 12,480,894 B2Sintokogio, Ltd.
- Measurement system and measurement method7 Oct 2025US 12,436,118 B2Kobe Steel, Ltd.
- Method for determining structure of substance in multicomponent sample18 Mar 2025US 12,253,482 B2Kirin Holdings Kabushiki Kaisha
- X-ray diffraction inspection system and method for operating same18 Dec 2025US 2025/0383307 A1Rtx Corporation
- Blanker-enhanced moire imaging27 Mar 2025US 2025/0104958 A1FEI Company
- Method for dislocation analysis10 Oct 2024US 2024/0337611 A1Oxford Instruments Nanotechnology Tools Limited
- X-ray diffraction method for the analysis of amorphous and semi-crystalline materials29 Feb 2024US 2024/0068966 A1Danmarks Tekniske Universitet
- Component residual stress testing platform based on neutron diffraction and experimental method thereof9 Nov 2023US 2023/0358693 A1Central Iron and Steel Research Institute
Most cited
By later US patents
- Method of determining a given characteristic of a material sample17US 5,442,676 AU. S. Philips Corporation · 1995
- Apparatus for use in examining the lattice of a semiconductor wafer by X-ray diffraction15US 4,078,175 A1978
- Method and system for determining strain distribution in a sample5US 10,209,206 B2Nova Measuring Instruments Ltd. · 2019
- X-ray diffraction method of mapping grain structures in a crystalline material sample, and an X-ray diffraction apparatus5US 9,222,900 B2Danmarks Tekniske Universitet of Anker Engelundsvej · 2015
- X-ray analysis apparatus4US 4,726,047 AU. S. Philips Corporation · 1988