X-ray analysis apparatus
AssigneeU.S. Philips Corporation
InventorsGeert Brouwer, Sipke Wadman
Life of this patent
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Abstract
In an X-ray analysis apparatus, a specimen to be examined is mounted on the circumference of a focusing cylinder, which can be rolled along an auxiliary cylinder arranged concentrically around the beam focus of an X-ray beam. Independently of the movement mechanism used, a fixed part of the specimen then remains continuously in the beam path. Invariably the same surface area of the specimen is irradiated by the X-ray beam. The movement mechanism may have added to it a device by means of which during the movement of the specimen and the detector the detector is continuously optimally directed to the specimen. The specimen holder may have added to it a device for rotating and/or tilting a specimen included therein.
Claims12
An X-ray analysis apparatus comprising
- an X-ray source providing an X-ray beam,
- monochromator means for focusing said X-ray beam in a line focus,
- displaceable preparation holder means for holding a specimen,
- a focusing cylinder movable in said X-ray beam to place said specimen in fixed positions in said X-ray beam,
- an auxiliary cylinder fixedly arranged around a beam focus of said X-ray beam, said focusing cylinder being rollable about said auxiliary cylinder so that said specimen retains the same surface area irradiated by said X-ray beam, wherein said auxiliary cylinder has a radius equal to the diameter of said focusing cylinder, and wherein said focusing cylinder is rollable in a slip-free manner along an internal surface of said auxiliary cylinder, and
- detector means rotatable along a surface of said focusing cylinder for detecting said X-ray beam.
Dependencies are inferred from the claim text.