G01N 2223/32
Adjustments of elements during operation
Official title: adjustments of elements during operation
G01N2223/32 (Adjustments of elements during operation) appears on 97 US grants and 116 published applications in this corpus.
Search patents in G01N- Granted patents
- 97
- Published applications
- 116
- Assignees
- 72
- Inventors
- 300
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 1 |
| 2007 | 0 | 1 |
| 2008 | 1 | 1 |
| 2009 | 2 | 1 |
| 2010 | 0 | 0 |
| 2011 | 0 | 2 |
| 2012 | 0 | 2 |
| 2013 | 1 | 2 |
| 2014 | 3 | 2 |
| 2015 | 3 | 4 |
| 2016 | 2 | 3 |
| 2017 | 4 | 5 |
| 2018 | 2 | 9 |
| 2019 | 5 | 11 |
| 2020 | 13 | 11 |
| 2021 | 13 | 8 |
| 2022 | 10 | 12 |
| 2023 | 6 | 14 |
| 2024 | 11 | 15 |
| 2025 | 10 | 6 |
| 2026 | 8 | 6 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
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- X-ray scattering apparatus and x-ray scattering method25 Aug 2026US 12,716,855 B2Xenocs SAS
- Ray scanning apparatus18 Aug 2026US 12,710,380 B2Nuctech Company Limited
- Analyzing method and analyzer19 May 2026US 12,631,578 B2JEOL Ltd.
- Tomographic imaging system geometry to mitigate artifacts1 Oct 2026US 2026/0298845 A1
- Control device, x-ray inspection device, control method, and control program for defect inspection27 Aug 2026US 2026/0251591 A1Ishida Co., Ltd.
- Diversifying sem measurement scheme for improved accuracy6 Aug 2026US 2026/0227350 A1ASML Netherlands B. V.
- Oral x-ray imaging system with integrated film and x-ray gun assembly for hands-free operation23 Jul 2026US 2026/0210877 A1
- Neutron diffraction stress measurement device and method based on spatial coordinate measurement4 Jun 2026US 2026/0153460 A1Shanghai Jiao Tong University
Most cited
By later US patents
- X-ray photoelectron emission spectrometry system47US 5,280,176 AThe United States of America as represented by the Secretary of Commerce · 1994
- X-ray fluorescence apparatus for contamination monitoring23US 10,634,628 B2Bruker Technologies Ltd. · 2020
- X-ray detection optics for small-angle X-ray scatterometry21US 10,976,270 B2Bruker Technologies Ltd. · 2021
- Apparatus and method for X-ray analysis with hybrid control of beam divergence20US 10,782,252 B2Malvern Panalytical Limited · 2020
- X-ray spectrometer and methods for use20US 11,054,375 B2University of Washington · 2021