G01N 2223/304
Electric circuits, signal processing
Official title: electric circuits, signal processing
G01N2223/304 (Electric circuits, signal processing) appears on 139 US grants and 173 published applications in this corpus.
Search patents in G01N- Granted patents
- 139
- Published applications
- 173
- Assignees
- 109
- Inventors
- 397
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1979 | 2 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 1 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 2 | 2 |
| 2008 | 0 | 1 |
| 2009 | 1 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 1 |
| 2013 | 2 | 1 |
| 2014 | 0 | 0 |
| 2015 | 2 | 2 |
| 2016 | 1 | 2 |
| 2017 | 6 | 31 |
| 2018 | 11 | 7 |
| 2019 | 9 | 10 |
| 2020 | 17 | 14 |
| 2021 | 11 | 12 |
| 2022 | 12 | 9 |
| 2023 | 13 | 22 |
| 2024 | 7 | 24 |
| 2025 | 24 | 21 |
| 2026 | 17 | 13 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- X-ray inspection apparatus6 Oct 2026US 12,754,147 B2Ishida Co., Ltd.
- Apparatus for analyzing composition and method thereof6 Oct 2026US 12,754,152 B23I Solution Inc.
- XRF analyzer with improved resolution by using micro-reset6 Oct 2026US 12,754,329 B2Evident Scientific, Inc.
- Determining tilt angle of substrate structures utilizing angular fourier decomposition of scattering images25 Aug 2026US 12,716,854 B2APPLIED Materials.Inc.
- System and method for calibrating a PET scanner28 Jul 2026US 12,693,441 B2Shanghai United Imaging Healthcare Co., Ltd.
- Method and Apparatus for Analysis27 Aug 2026US 2026/0251597 A1JEOL Ltd.
- System and method for capturing and processing ct scans20 Aug 2026US 2026/0243707 A1Honeywell Federal Manufacturing & Technologies, LLC
- Measurement system for and method of measuring moving web13 Aug 2026US 2026/0235537 A1Valmet Automation Oy
- Apparatus and system30 Jul 2026US 2026/0219209 A1Canon Kabushiki Kaisha
- Smart systems and methods for identification and processing of spent lithium cells9 Jul 2026US 2026/0194476 A1Li Industries, Inc.
Most cited
By later US patents
- Method for optimising a mixture of components by means of spectral analysis37US 10,228,708 B2Topnir Systems SAS · 2019
- X-ray generator and X-ray inspection apparatus23US 10,098,216 B2Ishida Co., Ltd. · 2018
- Method and apparatus for inspecting a substrate23US 7,171,038 B2KLA-Tencor Technologies Corporation · 2007
- Apparatus for reducing pulse pileup in an elemental analyzer measuring gamma rays arising from neutron capture in bulk substances22US 4,152,596 AMDH Industries, Inc. · 1979
- X-ray thin film inspection device20US 10,514,345 B2Rigaku Corporation · 2019