G01N 2223/104
Ions
Official title: ions
G01N2223/104 (Ions) appears on 9 US grants and 13 published applications in this corpus.
Search patents in G01N- Granted patents
- 9
- Published applications
- 13
- Assignees
- 13
- Inventors
- 43
- Latest grant
- 11 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 1 |
| 2009 | 1 | 0 |
| 2010 | 0 | 1 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 1 |
| 2014 | 0 | 0 |
| 2015 | 0 | 1 |
| 2016 | 1 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 1 |
| 2019 | 0 | 0 |
| 2020 | 0 | 1 |
| 2021 | 1 | 0 |
| 2022 | 0 | 0 |
| 2023 | 0 | 1 |
| 2024 | 0 | 0 |
| 2025 | 1 | 5 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Particle-induced x-ray emission using light and heavy particle beams11 Aug 2026US 12,704,469 B2FEI Company
- Integrated process and system for measurement and treatment of toxic gases in deep natural gas28 Jul 2026US 12,692,452 B2PetroChina Company Limited
- Lithium detection techniques using neutrons and/or alpha particles17 Jun 2025US 12,332,400 B2Schlumberger Technology Corporation
- Method for detecting fluorinated chemicals in liquid11 May 2021US 11,002,691 B2
- Bulk deposition for tilted mill protection9 Aug 2016US 9,412,560 B2FEI Company
- Methods and Systems for Determining Soil Texture Using Mobile Gamma Analysis22 Jan 2026US 2026/0023036 A1Carbon Asset Solutions (USA), Inc.
- 3d volume inspection method and method of configuring of a 3d volume inspection method27 Nov 2025US 2025/0362253 A1
- Counter counterfeit and embedded barcode technology17 Jul 2025US 2025/0231126 A1
- Particle-induced x-ray emission using light and heavy particle beams12 Jun 2025US 2025/0189469 A1FEI Company
- Radiation-measurement-instrument support device, radiation measurement apparatus, and radiation measurement method8 May 2025US 2025/0146956 A1Kabushiki Kaisha Toshiba
Most cited
By later US patents
- Method and apparatus for surface characterization and process control utilizing radiation from desorbed particles36US 4,393,311 ABell Telephone Laboratories, Incorporated · 1983
- Ion scattering spectrometer with modified bias8US 4,107,526 AMinnesota Mining and Manufacturing Company · 1978
- Bulk deposition for tilted mill protection5US 9,412,560 B2FEI Company · 2016
- Ion scattering spectroscope3US 5,371,366 AShimadzu Corporation · 1994
- Focused ion beam apparatus and sample section forming and thin-piece sample preparing methods2US 7,531,796 B2SII NanoTechnology Inc. · 2009