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US 5,371,366 AGranted
Ion scattering spectroscope
AssigneeShimadzu Corporation
InventorTakao Marui
Life of this patent
Estimating the term…
Abstract
A time-of-flight (TOF) type ion scattering spectroscope (ISS) using a mixture of ions of different masses. Ions having a mass smaller than the smallest mass of the atoms in the sample surface can precisely discriminate light-weight object atoms of slightly different masses. Ions having an intermediate mass between heavy-weight atoms and light-weight atoms in the sample surface can precisely discriminate heavy-weight object atoms of slightly different masses.
Claims8
An ion scattering spectroscope comprising:
- an ion source for generating and ejecting a mixture of ions of different known masses from an ion source material;
- an ion detector for detecting ions ejected from the ion source after the ions have collided with atoms about a sample and been scattered by the sample atoms, the mixture of ions including:
- a) ions of a mass smaller than a mass of the lightest of the sample atoms, and
- b) ions of another mass larger than the mass of the lightest of the sample atoms, and smaller in mass than the heaviest of the sample atoms;
- and
- a timer measuring a time interval from a certain time point before collision with the sample atoms until the ions are detected by the ion detector.
3 more elements
An ion scattering spectroscope comprising:
- an ion source for generating a mixture of ions of different known masses from an ion source material and for ejecting the ions as a beam;
- a beam chopper for chopping the beam of ions and for passing a short beam of ions;
- an ion detector for detecting ions passing through the beam chopper after the ions have collided with atoms about a sample and been scattered by the sample atoms, the ion beam including:
- a) ions of a mass smaller than a mass of the lightest of the sample atoms, and
- b) ions of another mass larger than the mass of the lightest of the sample atoms, and smaller in mass than the heaviest of the sample atoms;
- and
- a timer measuring a time interval from a time when the short beam of ions passes through the beam chopper until a time when the ions are detected by the ion detector.
4 more elements
Dependencies are inferred from the claim text.