G01N 2201/117
Indexed, memorised or programmed scan
G01N2201/117 (Indexed, memorised or programmed scan) appears on 3 US grants and 7 published applications in this corpus.
Search patents in G01N- Granted patents
- 3
- Published applications
- 7
- Assignees
- 7
- Inventors
- 17
- Latest grant
- 12 Mar 2024
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 1 |
| 2006 | 0 | 0 |
| 2007 | 1 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 1 |
| 2016 | 0 | 1 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 1 |
| 2020 | 0 | 0 |
| 2021 | 0 | 0 |
| 2022 | 0 | 1 |
| 2023 | 0 | 0 |
| 2024 | 1 | 0 |
| 2025 | 0 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- System and method for duration-based sample path adjustment20 Feb 2025US 2025/0060317 A1KLA Corporation
- Spectrophotometer, spectroscopic measurement method, and program29 Dec 2022US 2022/0412879 A1Hitachi High-Tech Science Corporation
- Spectroscopy apparatus and methods25 Jul 2019US 2019/0226995 A1Renishaw PLC
- Spectroscopy apparatus and methods18 Aug 2016US 2016/0238533 A1Renishaw PLC
- Scratch verification apparatus and method10 Dec 2015US 2015/0355099 A1Hamilton Sundstrand Corporation
Most cited
By later US patents