Spectrophotometer, spectroscopic measurement method, and program
AssigneeHitachi High-Tech Science Corporation
InventorsKai Maruyama, Takayuki Wakui
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AssigneeHitachi High-Tech Science Corporation
InventorsKai Maruyama, Takayuki Wakui
Estimating the term…
When a measurement sample whose absorbance greatly changes depending on a wavelength range is measured, measurement with a high S/N ratio and accuracy can be efficiently performed in a short time. For a plurality of wavelength ranges in wavelength scanning measurement of a measurement sample, based on measurement conditions including one of a plurality of dimming plates (16a to 16e) to be disposed in each wavelength range and a scanning speed of a wavelength to be set in each wavelength range, when wavelength scanning measurement in which the entire measurement wavelength range including all of the plurality of wavelength ranges is scanned at once is performed, a spectrophotometer (100) changes one of the plurality of dimming plates (16a to 16e) and the scanning speed according to the measurement conditions for each wavelength range.
A spectrophotometer, comprising:
A spectroscopic measurement method used in a spectrophotometer including
A program causing a spectrophotometer to execute a spectroscopic measurement method, the spectrophotometer including
Dependencies are inferred from the claim text.