Scratch verification apparatus and method
AssigneeHamilton Sundstrand Corporation
InventorsRussell Fordyce, Ryan Chase
Life of this patent
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Abstract
A scratch verification method and apparatus for detecting and analyzing defects in a surface, the apparatus include a detection device with a plurality of emission sources and a plurality of sensors. A processor is connected to the detection device and is configured to apply one or more sets of criteria to one or more corresponding target areas of a surface. The processor is further configured to differentiate between data from the one or more target areas.
Claims8
A method of verifying defects in a surface, comprising:
- aligning a verification apparatus with respect to a first target area of a surface;
- scanning a first target area of a surface with a detection device having one or emission sources and one or more sensors;
- processing information generated by the detection device with a processor to generate one or more data sets describing the first target area;
- comparing the one or more data sets describing the first target area with a first set of criteria associated with the first target area to determine an appropriate action.
A scratch verification apparatus for detecting and analyzing defects in a surface, comprising:
- a detection device having a plurality of emission sources and a plurality of sensors, wherein the emission sources include a first emission source emitting a first signal and a second emission source a second signal that differs from the first signal;
- a processor connected to the detection device, the processor configured to apply one or more sets of criteria to one or more corresponding target areas of a surface, the processor configured to differentiate between data from the one or more target areas;
- and
- a data source connected to the processor, the data source containing information regarding one or more boundaries of the one or more target areas, the data source further containing the one or more sets of criteria.
Dependencies are inferred from the claim text.