G01N 2021/8928
Haze defects, i.e. with a part of diffracted light
Official title: {Haze defects, i.e. with a part of diffracted light}
G01N2021/8928 (Haze defects, i.e. with a part of diffracted light) appears on 9 US grants and 10 published applications in this corpus.
Search patents in G01N- Granted patents
- 9
- Published applications
- 10
- Assignees
- 11
- Inventors
- 24
- Latest grant
- 18 May 2021
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| Year | Granted patents | Published applications |
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| 2001 | 1 | 0 |
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| 2004 | 0 | 1 |
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| 2006 | 1 | 0 |
| 2007 | 0 | 1 |
| 2008 | 1 | 0 |
| 2009 | 0 | 1 |
| 2010 | 0 | 1 |
| 2011 | 0 | 1 |
| 2012 | 2 | 1 |
| 2013 | 2 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 2 |
| 2018 | 0 | 0 |
| 2019 | 1 | 1 |
| 2020 | 0 | 0 |
| 2021 | 1 | 0 |
| 2022 | 0 | 1 |
By publication year.
Recent patents
- Fume determination method, substrate processing method, and substrate processing equipment18 May 2021US 11,011,398 B2SCREEN Holdings Co., Ltd.
- Method for detecting defects and associated device17 Dec 2019US 10,509,214 B2Soitec
- Inspection apparatus and inspection method22 Oct 2013US 8,563,958 B2Hitachi High-Technologies Corporation
- Thin-film inspection apparatus and inspection method30 Jul 2013US 8,497,991 B2Mitsubishi Heavy Industries, Ltd.
- Apparatus and method for measuring haze of sheet materials or other materials22 May 2012US 8,184,294 B2Honeywell International Inc.
- Compact in-line non-contact optical property measurement system3 Mar 2022US 2022/0065779 A1NDC Technologies, Inc.
- Fume determination method, substrate processing method, and substrate processing equipment6 Jun 2019US 2019/0172737 A1SCREEN Holdings Co., Ltd.
- Method for detecting defects and associated device15 Jun 2017US 2017/0168279 A1Soitec
- Apparatus and method for measuring haze of sheet materials or other materials using off-axis detector20 Apr 2017US 2017/0109895 A1Honeywell International Inc.
- Inspection apparatus and inspection method21 Jun 2012US 2012/0154797 A1Hitachi High-Technologies Corporation
Most cited
By later US patents
- Method for identifying materials, impurities and related defects with diffuse dispersion transparent objects18US 6,239,870 B1Heuft Systemtechnik GmbH · 2001
- Method to grain inspect directionally solidified castings3US 7,034,931 B2United Technologies Corporation · 2006
- Inspection apparatus and inspection method3US 8,101,935 B2Hitachi High-Technologies Corporation · 2012
- Method for measuring the degree of crosslinking of pressure sensitive adhesive1US 7,405,828 B2Daxon Technology Inc. · 2008
- Apparatus and method for measuring haze of sheet materials or other materials1US 8,184,294 B2Honeywell International Inc. · 2012