G01N 21/892
Characterised by the flaw, defect or object feature examined
Official title: characterised by the flaw, defect or object feature examined
G01N21/892 (Characterised by the flaw, defect or object feature examined) appears on 740 US grants and 735 published applications in this corpus.
Search patents in G01N- Granted patents
- 740
- Published applications
- 735
- Assignees
- 559
- Inventors
- 1,965
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 6 | 0 |
| 1977 | 9 | 0 |
| 1978 | 8 | 0 |
| 1979 | 2 | 0 |
| 1980 | 4 | 0 |
| 1981 | 8 | 0 |
| 1982 | 3 | 0 |
| 1983 | 4 | 0 |
| 1984 | 5 | 0 |
| 1985 | 4 | 0 |
| 1986 | 6 | 0 |
| 1987 | 3 | 0 |
| 1988 | 10 | 0 |
| 1989 | 4 | 0 |
| 1990 | 7 | 0 |
| 1991 | 6 | 0 |
| 1992 | 6 | 0 |
| 1993 | 7 | 0 |
| 1994 | 6 | 0 |
| 1995 | 8 | 0 |
| 1996 | 3 | 0 |
| 1997 | 7 | 0 |
| 1998 | 9 | 0 |
| 1999 | 9 | 0 |
| 2000 | 13 | 0 |
| 2001 | 6 | 1 |
| 2002 | 15 | 19 |
| 2003 | 20 | 12 |
| 2004 | 12 | 22 |
| 2005 | 18 | 20 |
| 2006 | 16 | 23 |
| 2007 | 11 | 32 |
| 2008 | 25 | 26 |
| 2009 | 14 | 14 |
| 2010 | 20 | 30 |
| 2011 | 16 | 20 |
| 2012 | 19 | 26 |
| 2013 | 13 | 26 |
| 2014 | 17 | 21 |
| 2015 | 27 | 29 |
| 2016 | 16 | 24 |
| 2017 | 25 | 35 |
| 2018 | 30 | 43 |
| 2019 | 52 | 50 |
| 2020 | 37 | 51 |
| 2021 | 32 | 39 |
| 2022 | 27 | 40 |
| 2023 | 21 | 41 |
| 2024 | 36 | 37 |
| 2025 | 40 | 25 |
| 2026 | 18 | 29 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01N 21/898Irregularities in textured or patterned surfaces263
- G01N 21/896Optical defects in or on transparent materials247
- G01N 21/894Pinholes63
- G01N 21/8921Streaks25
- G01N 21/8922Periodic flaws25
- G01N 2021/8924DentsIndexing code18
- G01N 2021/8925InclusionsIndexing code10
- G01N 2021/8927Defects in a structured webIndexing code10
All 9 subgroupsShow fewer
Recent patents
- Inspection apparatus, recording medium, and inspection system25 Aug 2026US 12,716,849 B2Konica Minolta, Inc.
- Method for detecting at least one defect on a support, device and computer program associated25 Aug 2026US 12,718,350 B2Aqc Industry
- Computer-implemented method and a computer system for generating a training dataset for training an artificial neural network2 Jun 2026US 12,645,938 B2Microtec S.R.L.
- Electrode plate wrinkling detection apparatus and cell production equipment19 May 2026US 12,630,386 B2Jiangsu Contemporary Amperex Technology Limited
- Method of monitoring the quality of absorbent sanitary articles, related production line and computer-program product28 Apr 2026US 12,611,724 B2Fameccanica, Data S.P A.
- Measuring of surface deformations on glass surfaces1 Oct 2026US 2026/0298838 A1Viprotron GmbH
- Surface defect detection system1 Oct 2026US 2026/0298839 A1Agteks Orme Ve Tekstil Endustrileri Sanayi Ve Ticaret Limited Sirket
- A method for detecting anomalies in an opening device10 Sep 2026US 2026/0266739 A1Tetra Laval Holdings & Finance S. A.
- Contamination detection in manufacturing using raman spectroscopy3 Sep 2026US 2026/0260947 A1Ford Global Technologies, LLC
- Non-destructive inspection of films using millimeter-wave radar13 Aug 2026US 2026/0235534 A1Brigham Young University (BYU)
Most cited
By later US patents
- Automated defect classification system281US 5,544,256 AInternational Business Machines Corporation · 1996
- Method and apparatus for analyzing an image to detect and identify patterns190US 6,650,779 B2Georgia Tech Research Corporation · 2003
- Defect detection system for lumber142US 5,960,104 AThe United States of America as represented by the Secretary of Agriculture · 1999
- Light collector for optical contaminant and flaw detector93US 4,601,576 ATencor Instruments · 1986
- Apparatus and method for characterizing defects in a transparent substrate84US 7,567,344 B2Corning Incorporated · 2009