Non-destructive inspection of films using millimeter-wave radar
AssigneeBrigham Young University (BYU)
InventorBrian A. Mazzeo
Life of this patent
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Abstract
A system and method for characterizing a film, such as a lithium-ion battery electrode film, are disclosed. The system includes a millimeter-wave radar module that receives return signals from a plurality of test point on the film. Conductivity metrics for the plurality of test points are computed based on the return signals. A laser sensor can be included to measure a physical thickness of the film at the test points. By correlating a two-dimensional conductivity map derived from the conductivity metrics with a two-dimensional topological map derived from the thickness data, defects in the film's conductivity can be detected.
Claims20
A method comprising:
- directing a millimeter-wave radar module to a test point on a film deposited on a conductive substrate, the millimeter-wave radar module having a boresight direction at a transmission angle relative to a surface of the film;
- transmitting a transmit signal from the millimeter-wave radar module towards the test point;
- redirecting the transmit signal after it has passed through the film to generate a return signal;
- receiving the return signal at the millimeter-wave radar module;
- determining an attenuation of the return signal relative to the transmit signal;
- and
- computing a conductivity metric for the test point based on the attenuation of the return signal.
A system comprising:
- a film disposed on a conductive substrate;
- a millimeter-wave radar module configured to:
- transmit a transmit signal towards the film, the transmit signal passing through the film at a test point and being redirected back to the millimeter-wave radar module as a return signal;
- and
- receive the return signal from the test point;
- a laser sensor configured to measure a thickness of the film at the test point;
- and
- a processor communicatively coupled to the millimeter-wave radar module and the laser sensor, the processor configured by software instructions to:
- determine an attenuation of the return signal relative to the transmit signal;
- and
- compute a conductivity metric for the test point based on the attenuation and the thickness of the film at the test point.
Dependencies are inferred from the claim text.