G01N 2021/8461
Investigating impurities in semiconductor
Official title: {Investigating impurities in semiconductor, e.g. Silicon}
G01N2021/8461 (Investigating impurities in semiconductor) appears on 60 US grants and 52 published applications in this corpus.
Search patents in G01N- Granted patents
- 60
- Published applications
- 52
- Assignees
- 39
- Inventors
- 105
- Latest grant
- 10 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 3 | 0 |
| 1992 | 2 | 0 |
| 1993 | 4 | 0 |
| 1994 | 1 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 1 | 0 |
| 2003 | 0 | 1 |
| 2004 | 1 | 0 |
| 2005 | 1 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 1 |
| 2012 | 0 | 0 |
| 2013 | 0 | 1 |
| 2014 | 1 | 3 |
| 2015 | 1 | 6 |
| 2016 | 2 | 2 |
| 2017 | 2 | 1 |
| 2018 | 5 | 4 |
| 2019 | 4 | 6 |
| 2020 | 5 | 6 |
| 2021 | 2 | 1 |
| 2022 | 7 | 7 |
| 2023 | 1 | 3 |
| 2024 | 6 | 5 |
| 2025 | 4 | 3 |
| 2026 | 2 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Measurement deviation analysis for a semiconductor specimen10 Mar 2026US 12,571,739 B2Applied Materials Israel Ltd.
- Blending of agricultural products via hyperspectral imaging and analysis10 Feb 2026US 12,546,654 B2Altria Client Services LLC
- On-line oil and foreign matter detection system and method employing hyperspectral imaging5 Aug 2025US 12,379,248 B2Altria Client Services LLC
- Method of forming optical proximity correction model and method of fabricating semiconductor device using the same8 Jul 2025US 12,354,920 B2Samsung Electronics Co., Ltd.
- Photoluminescence measurement device17 Jun 2025US 12,332,187 B2Commissariat A L' Energie Atomique Et Aux Energies Alternatives
- Blending of agricultural products via hyperspectral imaging and analysis21 May 2026US 2026/0139993 A1Altria Client Services LLC
- Surface inspection using laser triangulation21 May 2026US 2026/0140064 A1Onto Innovation Inc.
- On-line oil and foreign matter detection system and method employing hyperspectral imaging2 Oct 2025US 2025/0305876 A1Altria Client Services LLC
- Methods for determining suitability of czochralski growth conditions for producing substrates for epitaxy24 Apr 2025US 2025/0129512 A1GlobalWafers Co., Ltd.
- Methods for determining suitability of silicon substrates for epitaxy9 Jan 2025US 2025/0011968 A1GlobalWafers Co., Ltd.
Most cited
By later US patents
- Evaluation of surface and subsurface characteristics of a sample76US 4,632,561 ATherma-Wave, Inc. · 1986
- Method and apparatus for determining a material's characteristics by photoreflectance using improved computer control25US 5,270,797 ABrooklyn College Foundation · 1993
- Method and apparatus for determining a material's characteristics by photoreflectance21US 5,260,772 A1993
- Image processing apparatus17US 5,136,373 AHamamatsu Photonics K.K. · 1992
- On-line oil and foreign matter detection system and method employing hyperspectral imaging16US 11,222,203 B2Altria Client Services LLC · 2022