G01N 2021/4126
Index of thin films
Official title: {Index of thin films}
G01N2021/4126 (Index of thin films) appears on 44 US grants and 40 published applications in this corpus.
Search patents in G01N- Granted patents
- 44
- Published applications
- 40
- Assignees
- 44
- Inventors
- 114
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1987 | 2 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 2 | 0 |
| 1991 | 3 | 0 |
| 1992 | 4 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 1 | 1 |
| 2005 | 0 | 1 |
| 2006 | 1 | 0 |
| 2007 | 0 | 2 |
| 2008 | 0 | 1 |
| 2009 | 2 | 1 |
| 2010 | 0 | 0 |
| 2011 | 0 | 1 |
| 2012 | 2 | 0 |
| 2013 | 0 | 1 |
| 2014 | 0 | 0 |
| 2015 | 1 | 4 |
| 2016 | 1 | 3 |
| 2017 | 1 | 1 |
| 2018 | 2 | 5 |
| 2019 | 2 | 1 |
| 2020 | 3 | 3 |
| 2021 | 4 | 4 |
| 2022 | 6 | 6 |
| 2023 | 0 | 0 |
| 2024 | 3 | 0 |
| 2025 | 1 | 2 |
| 2026 | 1 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method and system for evaluation of an interaction between an analyte and a ligand using a biosensor22 Sep 2026US 12,742,776 B2Cytiva Sweden AB
- Method and device for analysing a sample using a resonant support, illuminated by infrared radiation28 Jan 2025US 12,209,956 B2Centre National De La Recherche Scientifique
- Method for measuring optical constants of thin film of fluorine-containing organosilicon compound1 Oct 2024US 12,105,018 B2Shin-Etsu Chemical Co., Ltd.
- Method and device for analysing a sample, implementing a resonant support27 Aug 2024US 12,072,282 B2Avalun
- Wave guide sensor16 Jul 2024US 12,038,605 B2Centre National De La Recherche Scientifique
- Optical thin film analysis apparatus not affected by substrate back surface reflection and analysis method thereof8 Oct 2026US 2026/0309623 A1
- Road surface condition detection apparatus and method for operating thereof30 Jul 2026US 2026/0219199 A1
- Thin film characteristic diagnosis device and thin film characteristic diagnosis method28 May 2026US 2026/0146944 A1Industry-Academic Cooperation Foundation, Yonsei University
- Devices, systems and methods for detecting microbial activity24 Jul 2025US 2025/0237610 A1The Procter & Gamble Company
- Diffusion discriminating gas sensors10 Jul 2025US 2025/0224386 A1
Most cited
By later US patents
- Method for film thickness and refractive index determination141US 4,909,631 A1990
- Method and apparatus for measuring properties of thin materials using polarized light117US 4,672,196 A1987
- Incremental monitoring of thin films42US 4,707,611 ARockwell International Corporation · 1987
- Diffraction grating coupler, system and method42US 8,335,414 B2Consejo Superior de Investigaciones Cientificas · 2012
- Method for measuring refractive index and thickness of film and apparatus therefor41US 5,420,680 ARicoh Company, Ltd. · 1995