G01J 2009/0234
Measurement of the fringe pattern
Official title: {Measurement of the fringe pattern}
G01J2009/0234 (Measurement of the fringe pattern) appears on 45 US grants and 42 published applications in this corpus.
Search patents in G01J- Granted patents
- 45
- Published applications
- 42
- Assignees
- 48
- Inventors
- 131
- Latest grant
- 25 Nov 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1985 | 1 | 0 |
| 1986 | 2 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 1 | 0 |
| 1992 | 1 | 0 |
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| 1997 | 0 | 0 |
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| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 1 |
| 2006 | 1 | 1 |
| 2007 | 1 | 3 |
| 2008 | 3 | 3 |
| 2009 | 3 | 2 |
| 2010 | 2 | 2 |
| 2011 | 0 | 1 |
| 2012 | 1 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 1 |
| 2015 | 0 | 2 |
| 2016 | 1 | 2 |
| 2017 | 1 | 2 |
| 2018 | 4 | 2 |
| 2019 | 4 | 3 |
| 2020 | 4 | 4 |
| 2021 | 3 | 4 |
| 2022 | 3 | 3 |
| 2023 | 0 | 2 |
| 2024 | 3 | 2 |
| 2025 | 4 | 1 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Spectrograph stabilization using a single-delay interferometer25 Nov 2025US 12,480,815 B2Lawrence Livermore National Security, LLC
- Digital adaptive optics encoder module5 Aug 2025US 12,379,575 B2The United States of America as represented by the Secretary of the Navy
- Device and method for phase imaging and element detection based on wavefront modulation29 Jul 2025US 12,372,414 B2Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- Differential holography22 Jul 2025US 12,366,824 B2Lawrence Livermore National Security, LLC
- Totagraphy: coherent diffractive/digital information reconstruction by iterative phase recovery using special masks9 Jul 2024US 12,031,868 B2Wavefront Analysis Systems LLC
- Polarimetric phase imaging13 Aug 2026US 2026/0235445 A1Centre National De La Recherche Scientifique
- Methods and systems for two-dimensional determination of the size and shape of a bright, micron-size light source using interferometry with a two-dimensional non-redundant aperture mask, including methods and systems for wavefront sensing20 Nov 2025US 2025/0354872 A1Associated Universities, Inc.
- Spectrograph stabilization using a single-delay interferometer20 Jun 2024US 2024/0201014 A1Lawrence Livermore National Security, LLC
- Digital Adaptive Optics Encoder Module1 Feb 2024US 2024/0036295 A1The United States of America as represented by the Secretary of the Navy
- Laser system, spectrum waveform calculation method, and electronic device manufacturing method2 Nov 2023US 2023/0349762 A1Gigaphoton Inc.
Most cited
By later US patents
- Apparatus and method for laser beam diagnosis50US 5,042,950 AThe United States of America as represented by the United States Department of Energy · 1991
- Real-time diffraction interferometer29US 4,624,569 ALockheed Missiles & Space Company, Inc. · 1986
- Method for measuring an optical length of light path and a laser interferometer for carrying same into effect25US 4,558,952 A1985
- Fringe pattern phase detection system18US 4,836,681 ALockheed Electronics Co., Inc. · 1989
- Optical image measuring apparatus for forming an image of an object to be measured based on interference light17US 7,268,885 B2Topcon Corporation · 2007