Methods and systems for two-dimensional determination of the size and shape of a bright, micron-size light source using interferometry with a two-dimensional non-redundant aperture mask, including methods and systems for wavefront sensing

Abstract

Systems and methods for a non-invasive determination of the characteristics of a light source include placing a non-redundant aperture mask in a path of light emanating from the light source, capturing an image of the interference pattern caused by the light passing through the non-redundant aperture mask, generating visibilities of the light distribution from the image, and determining the characteristics of the light source based on the visibilities of the light distribution, including a process of self-calibration in which the phase-solutions provide a sub-nanometer precision wavefront sensor, and through the use of closure amplitudes without requiring the process of self-calibration.

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