G01J 2005/0074
Radiation pyrometry: having separate detection of emissivity
Official title: {having separate detection of emissivity}
G01J2005/0074 (Radiation pyrometry: having separate detection of emissivity) appears on 64 US grants and 49 published applications in this corpus.
Search patents in G01J- Granted patents
- 64
- Published applications
- 49
- Assignees
- 69
- Inventors
- 191
- Latest grant
- 14 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 2 | 0 |
| 1990 | 4 | 0 |
| 1991 | 3 | 0 |
| 1992 | 3 | 0 |
| 1993 | 4 | 0 |
| 1994 | 5 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 1 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 2 |
| 2005 | 0 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 1 |
| 2008 | 0 | 0 |
| 2009 | 1 | 0 |
| 2010 | 0 | 3 |
| 2011 | 1 | 1 |
| 2012 | 1 | 0 |
| 2013 | 2 | 1 |
| 2014 | 1 | 3 |
| 2015 | 0 | 2 |
| 2016 | 2 | 0 |
| 2017 | 0 | 0 |
| 2018 | 2 | 2 |
| 2019 | 1 | 8 |
| 2020 | 5 | 3 |
| 2021 | 3 | 5 |
| 2022 | 3 | 5 |
| 2023 | 3 | 3 |
| 2024 | 4 | 9 |
| 2025 | 4 | 1 |
| 2026 | 4 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Estimation of the temperature of a steel product14 Jul 2026US 12,680,878 B2ArcelorMittal
- Substrate temperature measuring device, substrate processing apparatus including the same, and substrate temperature measuring method using the same30 Jun 2026US 12,669,382 B2Samsung Electronics Co., Ltd.
- Radiation temperature measurement device and radiation temperature measurement method12 May 2026US 12,625,005 B2Horiba, Ltd.
- Cleaning plant for metal products14 Apr 2026US 12,601,065 B2Danieli & C. Officine Meccaniche SpA
- Infrared imaging device and fixed pattern noise data generation method4 Nov 2025US 12,464,262 B2Mitsubishi Electric Corporation
- Method for emissivity-corrected pyrometry15 May 2025US 2025/0155291 A1Aixtron SE
- Cleaning plant for metal products14 Nov 2024US 2024/0376609 A1Danieli & C. Officine Meccaniche SpA
- Visual monitoring method for cross-section temperature fields and radiation characteristics of boiler furnaces by combining radiation images and spectra10 Oct 2024US 2024/0337538 A1China University of Mining and Technology
- Infrared imaging device and fixed pattern noise data generation method18 Jul 2024US 2024/0244348 A1Mitsubishi Electric Corporation
- Device for measuring temperature27 Jun 2024US 2024/0210253 A1LG Electronics Inc.
Most cited
By later US patents
- Method and apparatus for real-time wafer temperature measurement using infrared pyrometry in advanced lamp-heated rapid thermal processors473US 4,956,538 ATexas Instruments Incorporated · 1990
- Pyrometer multimeter143US 6,095,682 AOmega Engineering, Inc. · 2000
- Emissivity correction apparatus and method119US 4,919,542 AProcessing Technologies, LLC · 1990
- Multi-point pyrometry with real-time surface emissivity compensation110US 5,156,461 ATexas Instruments Incorporated · 1992
- Infrared imaging system for simultaneous generation of temperature, emissivity and fluorescence images65US 5,272,340 AAmara, Inc. · 1993