G01B 9/04
Measuring microscopes
G01B9/04 (Measuring microscopes) appears on 286 US grants and 232 published applications in this corpus.
Search patents in G01B- Granted patents
- 286
- Published applications
- 232
- Assignees
- 207
- Inventors
- 656
- Latest grant
- 16 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 4 | 0 |
| 1978 | 1 | 0 |
| 1979 | 1 | 0 |
| 1980 | 1 | 0 |
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 3 | 0 |
| 1986 | 0 | 0 |
| 1987 | 3 | 0 |
| 1988 | 1 | 0 |
| 1989 | 1 | 0 |
| 1990 | 2 | 0 |
| 1991 | 4 | 0 |
| 1992 | 3 | 0 |
| 1993 | 4 | 0 |
| 1994 | 3 | 0 |
| 1995 | 8 | 0 |
| 1996 | 2 | 0 |
| 1997 | 6 | 0 |
| 1998 | 10 | 0 |
| 1999 | 10 | 0 |
| 2000 | 8 | 0 |
| 2001 | 8 | 1 |
| 2002 | 5 | 3 |
| 2003 | 3 | 3 |
| 2004 | 4 | 11 |
| 2005 | 5 | 8 |
| 2006 | 12 | 7 |
| 2007 | 2 | 11 |
| 2008 | 3 | 6 |
| 2009 | 8 | 8 |
| 2010 | 4 | 5 |
| 2011 | 11 | 11 |
| 2012 | 5 | 11 |
| 2013 | 6 | 12 |
| 2014 | 9 | 14 |
| 2015 | 19 | 14 |
| 2016 | 12 | 13 |
| 2017 | 11 | 8 |
| 2018 | 13 | 9 |
| 2019 | 8 | 11 |
| 2020 | 10 | 8 |
| 2021 | 5 | 12 |
| 2022 | 14 | 11 |
| 2023 | 7 | 11 |
| 2024 | 9 | 11 |
| 2025 | 10 | 6 |
| 2026 | 5 | 7 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Adjustment method for shape measuring device16 Jun 2026US 12,656,100 B2Tokyo Seimitsu Co., Ltd.
- Optical planar metrology mounting device and methods for abrasive cross-sectioning of electrical components9 Jun 2026US 12,650,294 B2The United States of America as represented by the Secretary of the Navy
- Detection system, compensation method, and computer readable medium for semiconductor surface morphology14 Apr 2026US 12,601,582 B2Chroma Ate Inc.
- High effective refractive index materials for ultra-high resolution illumination nanoscopy14 Apr 2026US 12,601,902 B2The Regents at the University of California
- Interferometric system with deep learning algorithm to process two interferograms17 Mar 2026US 12,578,180 B2Arizona Board of Regents on Behalf of the University of Arizona
- Apparatus for an optical imaging system, optical imaging system, method and computer program8 Oct 2026US 2026/0309971 A1Leica Instruments (Singapore) Pte. Ltd.
- Device for layer thickness measurement and method therefor25 Jun 2026US 2026/0179240 A1Leica Microsystems CMS GmbH
- Three-dimensional morphology detection device and measurement method for determining depth of high aspect ratio microstructures thereof18 Jun 2026US 2026/0168785 A1Industrial Technology Research Institute
- Method for super-resolution microscopic interferometric measurement based on broadband annular radially polarized light28 May 2026US 2026/0146849 A1Nanjing University of Science and Technology
- Method and device for determining a local height of a sample surface7 May 2026US 2026/0126284 A1Mitutoyo Corporation
Most cited
By later US patents
- Tandem linear scanning confocal imaging system with focal volumes at different heights499US 5,248,876 AInternational Business Machines Corporation · 1993
- Confocal measuring microscope with automatic focusing340US 4,844,617 ATencor Instruments · 1989
- Optical device with an illuminating grid and detector grid arranged confocally to an object239US 5,239,178 ACarl Zeiss AG · 1993
- Surgical microscope for conducting computer-supported stereotactic microsurgery and a method for operating the same219US 5,359,417 ACarl-Zeiss-Stiftung · 1994
- Arrangements and methods for providing multimodality microscopic imaging of one or more biological structures195US 7,872,759 B2The General Hospital Corporation · 2011