G01B 9/02088
Matching signals with a database
Official title: {Matching signals with a database}
G01B9/02088 (Matching signals with a database) appears on 51 US grants and 55 published applications in this corpus.
Search patents in G01B- Granted patents
- 51
- Published applications
- 55
- Assignees
- 26
- Inventors
- 72
- Latest grant
- 24 Jun 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 1 |
| 2004 | 0 | 4 |
| 2005 | 1 | 3 |
| 2006 | 4 | 5 |
| 2007 | 2 | 4 |
| 2008 | 9 | 7 |
| 2009 | 5 | 9 |
| 2010 | 3 | 2 |
| 2011 | 8 | 0 |
| 2012 | 2 | 4 |
| 2013 | 1 | 3 |
| 2014 | 2 | 1 |
| 2015 | 2 | 3 |
| 2016 | 3 | 1 |
| 2017 | 0 | 1 |
| 2018 | 2 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 0 |
| 2021 | 0 | 2 |
| 2022 | 1 | 2 |
| 2023 | 3 | 1 |
| 2024 | 1 | 1 |
| 2025 | 1 | 0 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Systems and methods for surface profile estimation via optical coherence tomography24 Jun 2025US 12,336,785 B2Mitsubishi Electric Research Laboratories, Inc.
- Method and system for measuring a surface of an object comprising different structures using low coherence interferometry20 Feb 2024US 11,906,302 B2Unity Semiconductor Corporation
- Method and system for measuring a surface of an object comprising different structures using low coherence interferometry1 Aug 2023US 11,713,960 B2Unity Semiconductor Corporation
- Optical coherence tomography (OCT) apparatus and OCT method for axial tracking and flattening4 Jul 2023US 11,690,516 B2University of Kent
- Measurement of properties of patterned photoresist9 May 2023US 11,644,419 B2KLA Corporation
- Optical coherence tomography system for ranging applications13 Aug 2026US 2026/0235394 A1Careglance Srl
- Systems and methods for surface profile estimation via optical coherence tomography21 Mar 2024US 2024/0090768 A1Mitsubishi Electric Research Laboratories, Inc.
- Method and system for measuring a surface of an object comprising different structures using low coherence interferometry10 Aug 2023US 2023/0251079 A1Unity Semiconductor Corporation
- Measurement of properties of patterned photoresist28 Jul 2022US 2022/0236181 A1KLA Corporation
- Method and system for measuring a surface of an object comprising different structures using low coherence interferometry13 Jan 2022US 2022/0011088 A1Unity Semiconductor Corporation
Most cited
By later US patents
- Fiberoptic interferometer and associated method for analyzing tissue196US 5,920,390 AThe Charlotte-Mecklenburg Hospital Authority · 1999
- Scanning interferometry for thin film thickness and surface measurements73US 7,324,210 B2Zygo Corporation · 2008
- Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures62US 7,139,081 B2Zygo Corporation · 2006
- Interferometer and method for measuring characteristics of optically unresolved surface features61US 7,324,214 B2Zygo Corporation · 2008
- Interferometer for determining characteristics of an object surface, including processing and calibration61US 7,428,057 B2Zygo Corporation · 2008