G01B 3/008
Arrangements for controlling the measuring force
Official title: {Arrangements for controlling the measuring force}
G01B3/008 (Arrangements for controlling the measuring force) appears on 171 US grants and 96 published applications in this corpus.
Search patents in G01B- Granted patents
- 171
- Published applications
- 96
- Assignees
- 86
- Inventors
- 290
- Latest grant
- 14 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 1 | 0 |
| 1980 | 3 | 0 |
| 1981 | 2 | 0 |
| 1982 | 5 | 0 |
| 1983 | 3 | 0 |
| 1984 | 5 | 0 |
| 1985 | 3 | 0 |
| 1986 | 5 | 0 |
| 1987 | 4 | 0 |
| 1988 | 3 | 0 |
| 1989 | 6 | 0 |
| 1990 | 2 | 0 |
| 1991 | 3 | 0 |
| 1992 | 3 | 0 |
| 1993 | 3 | 0 |
| 1994 | 5 | 0 |
| 1995 | 3 | 0 |
| 1996 | 0 | 0 |
| 1997 | 2 | 0 |
| 1998 | 3 | 0 |
| 1999 | 3 | 0 |
| 2000 | 1 | 0 |
| 2001 | 5 | 3 |
| 2002 | 4 | 1 |
| 2003 | 5 | 5 |
| 2004 | 3 | 4 |
| 2005 | 4 | 5 |
| 2006 | 5 | 5 |
| 2007 | 5 | 4 |
| 2008 | 1 | 3 |
| 2009 | 0 | 6 |
| 2010 | 9 | 3 |
| 2011 | 5 | 5 |
| 2012 | 4 | 3 |
| 2013 | 2 | 3 |
| 2014 | 4 | 3 |
| 2015 | 3 | 5 |
| 2016 | 4 | 3 |
| 2017 | 3 | 2 |
| 2018 | 3 | 7 |
| 2019 | 6 | 9 |
| 2020 | 5 | 4 |
| 2021 | 9 | 5 |
| 2022 | 4 | 1 |
| 2023 | 3 | 1 |
| 2024 | 1 | 6 |
| 2025 | 2 | 0 |
| 2026 | 3 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Displacement measuring instrument14 Jul 2026US 12,680,802 B2Mitutoyo Corporation
- Automatic measuring system and control method for automatic measuring system14 Jul 2026US 12,681,029 B2Mitutoyo Corporation
- Automatic measuring device and control method of the same24 Mar 2026US 12,584,734 B2Mitutoyo Corporation
- Measurement system and checking method4 Nov 2025US 12,460,914 B2Sintokogio, Ltd.
- Motion mechanism for measuring probe29 Apr 2025US 12,287,194 B2Mitutoyo Corporation
- Automatic measuring system and control method for automatic measuring system17 Oct 2024US 2024/0345116 A1Mitutoyo Corporation
- Displacement measuring instrument3 Oct 2024US 2024/0328767 A1Mitutoyo Corporation
- Motion mechanism for measuring probe30 May 2024US 2024/0175668 A1Mitutoyo Corporation
- Systems and methods for robust distance measurement11 Apr 2024US 2024/0118068 A1Wastewizer, LLC
- Automatic measuring device and control method of the same1 Feb 2024US 2024/0035816 A1Mitutoyo Corporation
Most cited
By later US patents
- Metrology111US 5,209,131 A1993
- Dual stage instrument for scanning a specimen87US 5,948,972 AKLA-Tencor Corporation · 1999
- Dual stage instrument for scanning a specimen85US 6,267,005 B1KLA-Tencor Corporation · 2001
- Oscillating scanning probe with constant contact force66US 7,779,553 B2Hexagon Metrology, Inc. · 2010
- Displacement-measuring apparatus, and static-pressure bearing device for use in the displacement-measuring apparatus59US 5,174,039 AKabushiki Kaisha Toshiba · 1992