Measurement system and checking method
AssigneeSintokogio, Ltd.
InventorsYoshikane Tanaami, Miyuki Hayashi
Life of this patent
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AssigneeSintokogio, Ltd.
InventorsYoshikane Tanaami, Miyuki Hayashi
Estimating the term…
In a measurement system, a processor sets, on the basis of three-dimensional data, a movement route to be taken by a hand part to cause a contact to follow the surface of an object to be measured in such a manner that a reaction force detected by a force sensor becomes a predetermined value. The processor causes the contact to follow the surface of the object to be measured while adjusting the reaction force to become a predetermined value, and acquires a path taken by the hand part having moved. The processor acquires the roughness of the surface of the object to be measured from the contact during a period in which the contact is caused to follow the surface. The processor measures the dimension of the object to be measured on the basis of the path and at least one of the movement route and the three-dimensional data.
A measurement system comprising:
Dependencies are inferred from the claim text.