Motion mechanism for measuring probe
AssigneeMitutoyo Corporation
InventorIsaiah Freerksen
Life of this patent
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AssigneeMitutoyo Corporation
InventorIsaiah Freerksen
Estimating the term…
A measuring probe includes a stylus having one or more contact portions; a detection element configured to detect a movement of the stylus based on a contact made by the contact portions; a signal processing portion configured to process a signal from the detection element to output a measurement signal; and a stylus motion mechanism. The stylus motion mechanism includes a first motion portion configured to enable motion of the stylus from a rest position in a positive axial direction when a corresponding force in the positive axial direction is applied by a contact of a contact portion of the stylus with a workpiece; and a second motion portion configured to enable motion of the stylus from the rest position in a negative axial direction opposite to the positive axial direction when a corresponding force is applied by a contact of a contact portion of the stylus with a workpiece.
A measuring system, comprising:
A method for operating a measuring system including a measuring probe,
A stylus motion mechanism for utilization in a measuring probe,
Dependencies are inferred from the claim text.