G01B 2290/50
Pupil plane manipulation
Official title: Pupil plane manipulation, e.g. filtering light of certain reflection angles
G01B2290/50 (Pupil plane manipulation) appears on 42 US grants and 36 published applications in this corpus.
Search patents in G01B- Granted patents
- 42
- Published applications
- 36
- Assignees
- 22
- Inventors
- 60
- Latest grant
- 28 Oct 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 2 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 0 |
| 2003 | 2 | 1 |
| 2004 | 0 | 1 |
| 2005 | 0 | 3 |
| 2006 | 3 | 1 |
| 2007 | 2 | 5 |
| 2008 | 6 | 4 |
| 2009 | 2 | 2 |
| 2010 | 2 | 1 |
| 2011 | 2 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 3 |
| 2014 | 0 | 1 |
| 2015 | 1 | 2 |
| 2016 | 2 | 1 |
| 2017 | 2 | 3 |
| 2018 | 3 | 4 |
| 2019 | 3 | 2 |
| 2020 | 4 | 0 |
| 2021 | 0 | 0 |
| 2022 | 0 | 1 |
| 2023 | 1 | 0 |
| 2024 | 0 | 1 |
| 2025 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Single frame-tilted wave interferometer28 Oct 2025US 12,455,157 B2Universität Stuttgart
- Method for compensation during the process of wavefront reconstruction in grating-based lateral shearing interferometry24 Jan 2023US 11,561,082 B2Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- System and method for a displacement measurement24 Nov 2020US 10,845,191 B2Nikon Corporation
- Interferometer using tilted object waves and comprising a Fizeau interferometer objective7 Apr 2020US 10,612,905 B2Universitaet Stuttgart
- Optical sectioning using a phase pinhole28 Jan 2020US 10,545,458 B2B. G. Negev Technologies and Applications Ltd., At Ben-Gurion University
- Single frame-tilted wave interferometer4 Jan 2024US 2024/0003672 A1Universität Stuttgart
- Method for compensation during the process of wavefront reconstruction in grating-based lateral shearing interferometry29 Dec 2022US 2022/0412720 A1Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences
- System and method for a displacement measurement1 Aug 2019US 2019/0234729 A1Nikon Corporation
- Measuring device for interferometric determination of a shape of an optical surface23 May 2019US 2019/0154427 A1Carl Zeiss SMT GmbH
- Interferometer using tilted object waves and comprising a fizeau interferometer objective15 Nov 2018US 2018/0328711 A1Universitaet Stuttgart
Most cited
By later US patents
- Method and apparatus for correcting surface profiles determined by phase-shifting interferometry according to optical parameters of test surface78US 5,602,643 AWyko Corporation · 1997
- Scanning interferometry for thin film thickness and surface measurements73US 7,324,210 B2Zygo Corporation · 2008
- Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures62US 7,139,081 B2Zygo Corporation · 2006
- Interferometer and method for measuring characteristics of optically unresolved surface features61US 7,324,214 B2Zygo Corporation · 2008
- Profiling complex surface structures using scanning interferometry59US 7,106,454 B2Zygo Corporation · 2006