G01B 11/14
Measuring arrangements characterised by the use of optical techniques: for measuring distance
Official title: for measuring distance or clearance between spaced objects or spaced apertures (G01B11/26 takes precedence; rangefinders G01C3/00)
G01B11/14 (Measuring arrangements characterised by the use of optical techniques: for measuring distance) appears on 1,980 US grants and 2,139 published applications in this corpus.
Search patents in G01B- Granted patents
- 1,980
- Published applications
- 2,139
- Assignees
- 1,041
- Inventors
- 4,372
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 6 | 0 |
| 1977 | 5 | 0 |
| 1978 | 2 | 0 |
| 1979 | 3 | 0 |
| 1980 | 5 | 0 |
| 1981 | 4 | 0 |
| 1982 | 3 | 0 |
| 1983 | 1 | 0 |
| 1984 | 5 | 0 |
| 1985 | 7 | 0 |
| 1986 | 11 | 0 |
| 1987 | 4 | 0 |
| 1988 | 7 | 0 |
| 1989 | 4 | 0 |
| 1990 | 5 | 0 |
| 1991 | 3 | 0 |
| 1992 | 3 | 0 |
| 1993 | 7 | 0 |
| 1994 | 7 | 0 |
| 1995 | 9 | 0 |
| 1996 | 9 | 0 |
| 1997 | 12 | 0 |
| 1998 | 15 | 0 |
| 1999 | 9 | 0 |
| 2000 | 7 | 0 |
| 2001 | 10 | 3 |
| 2002 | 5 | 13 |
| 2003 | 17 | 12 |
| 2004 | 12 | 16 |
| 2005 | 7 | 12 |
| 2006 | 16 | 19 |
| 2007 | 12 | 21 |
| 2008 | 17 | 22 |
| 2009 | 11 | 32 |
| 2010 | 22 | 25 |
| 2011 | 7 | 44 |
| 2012 | 25 | 59 |
| 2013 | 68 | 169 |
| 2014 | 86 | 186 |
| 2015 | 164 | 265 |
| 2016 | 172 | 197 |
| 2017 | 212 | 175 |
| 2018 | 178 | 157 |
| 2019 | 185 | 138 |
| 2020 | 147 | 128 |
| 2021 | 95 | 105 |
| 2022 | 91 | 82 |
| 2023 | 77 | 76 |
| 2024 | 75 | 80 |
| 2025 | 69 | 60 |
| 2026 | 47 | 43 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
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- Clearance measuring apparatus1 Sep 2026US 12,723,869 B2Samsung SDI.Co., Ltd.
- Distance measurement device, distance measurement method, and distance measurement program25 Aug 2026US 12,716,711 B2FUJIFILM Corporation
- Aircraft and method for inspecting equipment in coking plants to detect sources of error25 Aug 2026US 12,718,343 B2thyssenkrupp AG
- Inspection system, inspection method, and storage medium17 Sep 2026US 2026/0278764 A1Tokyo Electron Limited
- Displacement sensing10 Sep 2026US 2026/0266594 A1UNM Rainforest Innovations
- Modular metrology apparatus for interchangeable process modules10 Sep 2026US 2026/0269171 A1
- Method to stabilize a wavelength of a tunable laser device, tunable laser device, and position measurement system provided with the tunable laser device3 Sep 2026US 2026/0261090 A1ASML Netherlands B. V.
- Component inspection method and device27 Aug 2026US 2026/0251441 A1Nissan Motor Co., Ltd.
Most cited
By later US patents
- Apparatus and method for calculating a wafer position in a processing chamber under process conditions510US 9,117,866 B2ASM IP Holding B. V. · 2015
- Optical grid enhancement for improved motor location487US 8,976,368 B2Intermec IP Corp. · 2015
- Arrangements and methods for determining positions and offsets419US 8,860,955 B2Lam Research Corporation · 2014
- Estimating distance to an object using a sequence of images recorded by a monocular camera403US 8,164,628 B2Mobileye Technologies Ltd. · 2012
- Critical dimension analysis with simultaneous multiple angle of incidence measurements357US 6,429,943 B1Therma-Wave, Inc. · 2002