Testmetrix, Inc.
San Jose, CA, US· latest recorded location
Testmetrix, Inc. is named on 4 US grants and 5 published applications in this corpus. Its most frequent classification is G01R (Measuring electric variables).
- Granted patents
- 4
- Published applications
- 5
- Inventors
- 3
- Granted in 2026 so far
- 1
- Most recent grant
- 17 Feb 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2007 | 0 | 1 |
| 2008 | 0 | 1 |
| 2009 | 1 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 0 | 2 |
| 2021 | 0 | 0 |
| 2022 | 1 | 0 |
| 2023 | 1 | 0 |
| 2024 | 0 | 1 |
| 2025 | 0 | 0 |
| 2026 | 1 | 0 |
By publication year. 2026 runs to 8 Oct.
Technology areas
Share of 9 documents
Recent patents
- Apparatus and method for testing semiconductor devices17 Feb 2026US 12,553,945 B2
- Apparatus and methods for testing semiconductor devices28 Feb 2023US 11,594,435 B2
- Apparatus and method for testing semiconductor devices1 Feb 2022US 11,237,208 B2
- Apparatus having a member to receive a tray(s) that holds semiconductor devices for testing5 May 2009US 7,528,617 B2
- Apparatus and Method for Testing Semiconductor Devices3 Oct 2024US 2024/0329134 A1
- Apparatus and Methods for Testing Semiconductor Devices27 Aug 2020US 2020/0273733 A1
- Apparatus and Method for Testing Semiconductor Devices6 Feb 2020US 2020/0041564 A1
- Apparatus and method for testing semiconductor devices14 Aug 2008US 2008/0191725 A1
- Apparatus and method for testing semiconductor devices13 Sep 2007US 2007/0210811 A1
Most cited
By later US patents