Apparatus and method for testing semiconductor devices
AssigneeTestmetrix, Inc.
InventorsChristian O. Cojocneanu, Doru G. Iosub
Life of this patent
Estimating the term…
Abstract
An apparatus for testing semiconductor devices includes a table having receptacles for trays holding semiconductor devices to be tested. An interface is positioned between the receptacles and at least one test device. The interface is customized to electrically connect the semiconductor devices to the at least one test device. The apparatus also includes a press that moves toward the table and applies force to each of the semiconductor devices, thereby securing the semiconductor devices in place for testing and securing the electrical connection to the interface.
Claims27
An apparatus for testing a plurality of semiconductor devices, comprising:
- a body comprising a first member and a movable surface opposite said first member and configured to be movable toward and away from said first member;
- said first member comprising a first surface opposite said movable surface, a receptacle portion, and a second surface opposite said first surface, wherein said first member defines at least one opening that extends through said first member from said first surface to said second surface;
- said receptacle portion configured to receive a tray holding a plurality of semiconductor devices having exposed electrical contacts, such that the exposed electrical contacts of each of the semiconductor devices would be adjacent to said at least one opening and accessible from said second surface of said first member;
- and
- said movable surface comprising a plurality of extending members, each located at a predetermined position on said movable surface facing said first member, whereby when said movable surface is a predetermined distance from said first member each one of said extending members contacts a corresponding one of the semiconductor devices to secure its placement in the tray.
An apparatus for testing a plurality of semiconductor devices, comprising:
- means for receiving a tray holding the plurality of semiconductor devices;
- and
- means for securing the plurality of semiconductor devices within the tray for testing.
A method of testing a plurality of semiconductor devices, comprising:
- placing a tray holding a plurality of semiconductor devices into a receptacle configured to hold said tray;
- contacting electrical contacts of each of said semiconductor devices with an electrical interface electrically connected to one or more test devices;
- applying force to each one of said semiconductor devices, thereby securing each one of said semiconductor devices in place within the tray;
- and
- performing one or more tests on each one of the semiconductor devices.
A method for securing a plurality of semiconductor devices in place for testing, comprising:
- placing a tray holding a plurality of semiconductor devices into a receptacle configured to hold said tray;
- contacting electrical contacts of each of said semiconductor devices with an electrical interface configured to be electrically connected to one or more test devices;
- and
- applying force on each one of said semiconductor devices, thereby securing each one of said semiconductor devices in place within the tray.
Dependencies are inferred from the claim text.