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US 7,528,617 B2Granted
Apparatus having a member to receive a tray(s) that holds semiconductor devices for testing
AssigneeTestmetrix, Inc.
InventorsChristian O. Cojocneanu, Doru G. Iosub
Life of this patent
Estimating the term…
Abstract
An apparatus for testing semiconductor devices includes a table having receptacles for trays holding semiconductor devices to be tested. An interface is positioned between the receptacles and at least one test device. The interface is customized to electrically connect the semiconductor devices to the at least one test device. The apparatus also includes a press that moves toward the table and applies force to each of the semiconductor devices, thereby securing the semiconductor devices in place for testing and securing the electrical connection to the interface.
Claims24
An apparatus for testing a plurality of semiconductor devices, comprising:
- a body comprising a first member and a movable surface opposite said first member and configured to be movable toward and away from said first member;
- said first member comprising a first surface opposite said movable surface, a receptacle portion, and a second surface opposite said first surface, wherein said first member defines at least one opening that extends through said first member from said first surface to said second surface;
- said receptacle portion configured to receive a tray holding a plurality of semiconductor devices having exposed electrical contacts, such that the exposed electrical contacts of each of the semiconductor devices are accessible from said second surface of said first member through said at least one opening;
- said movable surface comprising a plurality of extending members, each located at a predetermined position on said movable surface facing said first member, whereby when said movable surface is a predetermined distance from said first member each one of said extending members contacts a corresponding one of the semiconductor devices to secure its placement in the tray;
- and
- an interface connected to said body, said interface comprising a first electrical interface configured for electrical connection to the exposed electrical contacts of each of the semiconductor devices and a second electrical interface electrically connected to said first electrical interface and having electrical contacts for connection to a test device, wherein said first electrical interface is separately removable from said interface.
3 more elements
An apparatus for testing a plurality of semiconductor devices, comprising:
- a body comprising a first member, said first member comprising a first surface, an opposite second surface, and a plurality of receptacle portions disposed on said first surface, and defining a plurality of openings that extend through said first member from said first surface to said second surface, wherein each one of said openings is adjacent to one of said receptacle portions and wherein each of said receptacle portions is configured to receive a tray holding a plurality of semiconductor devices having exposed electrical contacts such that the exposed electrical contacts of each of the semiconductor devices are accessible from said second surface of said first member through one of said openings;
- and
- a plurality of interfaces, each one of said interfaces positioned adjacent to a corresponding one of said openings and each configured to provide an electrical connection between the electrical contacts of each of the semiconductor devices and a test device.
An apparatus for testing a plurality of semiconductor devices, comprising:
- a body comprising a first member, said first member comprising a first surface, an opposite second surface, and at least one receptacle portion disposed on said first surface, and defining at least one opening that extends through said first member from said first surface to said second surface, wherein said at least one receptacle portion is configured to receive a tray holding a plurality of semiconductor devices having exposed electrical contacts such that the exposed electrical contacts of each of the semiconductor devices are accessible from said second surface of said first member through said at least one opening;
- and
- an interface connected to said body, said interface comprising a first electrical interface having a first set of electrical contacts configured for electrical connection to the exposed electrical contacts of each of the semiconductor devices and having a second set of electrical contacts and a second electrical interface having a first set of electrical contacts for electrical connection to said second set of electrical contacts of said first electrical interface and having a second set of electrical contacts for connection to a test device, wherein said first electrical interface is separately removable from said interface.
Dependencies are inferred from the claim text.