Altatech Semiconductor
Montbonnot-Saint-Martin, FR· latest recorded location
Altatech Semiconductor is named on 7 US grants and 8 published applications in this corpus. Its most frequent classification is G01N (Investigating or analysing materials by determining their chemical or physical properties).
- Granted patents
- 7
- Published applications
- 8
- Inventors
- 17
- Granted in 2026 so far
- 0
- Most recent grant
- 14 Nov 2017
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 2009 | 0 | 1 |
| 2010 | 1 | 0 |
| 2011 | 0 | 2 |
| 2012 | 0 | 1 |
| 2013 | 0 | 1 |
| 2014 | 1 | 2 |
| 2015 | 2 | 0 |
| 2016 | 1 | 1 |
| 2017 | 2 | 0 |
By publication year.
Technology areas
Share of 15 documents
- G01NInvestigating or analysing materials by determining their chemical or physical properties10
- H10PGeneric processes or apparatus for the manufacture or treatment of devices covered6
- C23CCoating metallic material5
- G01BMeasuring length, thickness or similar linear dimensions2
- G02BOptical elements, systems or apparatus2
Recent patents
- Device and method for inspecting semiconductor materials14 Nov 2017US 9,816,942 B2
- Chemical vapor deposition device3 Oct 2017US 9,777,374 B2
- Dark-field semiconductor wafer inspection device12 Jul 2016US 9,389,189 B2
- Device and method for inspecting semiconductor wafers14 Apr 2015US 9,007,456 B2
- Device and process for chemical vapor phase treatment3 Mar 2015US 8,967,081 B2
- Chemical vapour deposition device7 Jan 2016US 2016/0002788 A1
- Device and method for inspecting semi-conductor materials25 Sep 2014US 2014/0285797 A1
- Dark-field semiconductor wafer inspection device18 Sep 2014US 2014/0268121 A1
- Chemical gas deposition reactor23 May 2013US 2013/0125819 A1
- Device and method for inspecting semiconductor wafers8 Mar 2012US 2012/0057155 A1
Most cited
By later US patents
- Device and process for chemical vapor phase treatment11US 8,967,081 B22015
- Method for detecting surface defects on a substrate and device using said method3US 7,812,942 B22010
- Device and method for inspecting semiconductor wafers3US 8,654,324 B22014
- Device and method for inspecting semiconductor wafers2US 9,007,456 B22015