Y10S 977/866
Scanning capacitance probe
Y10S977/866 (Scanning capacitance probe) appears on 14 US grants and 5 published applications in this corpus.
Search patents in Y10S- Granted patents
- 14
- Published applications
- 5
- Assignees
- 13
- Inventors
- 22
- Latest grant
- 21 Dec 2010
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 2 | 0 |
| 2003 | 1 | 0 |
| 2004 | 1 | 2 |
| 2005 | 2 | 2 |
| 2006 | 1 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 0 |
| 2009 | 0 | 1 |
| 2010 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Apparatus and method for scanning capacitance microscopy and spectroscopy21 Dec 2010US 7,856,665 B2Asylum Research Corporation
- Method for measuring nm-scale tip-sample capacitance4 Apr 2006US 7,023,220 B2The Ohio State University
- Electrical scanning probe microscope apparatus13 Dec 2005US 6,975,129 B2National Applied Research Labratories
- Direct, low frequency capacitance measurement for scanning capacitance microscopy15 Feb 2005US 6,856,145 B2The Ohio State University
- Method of measuring electrical capacitance7 Dec 2004US 6,828,804 B2Sharp Kabushiki Kaisha
- Apparatus and method for scanning capacitance microscopy and spectroscopy2 Apr 2009US 2009/0084952 A1Asylum Research Corporation
- Method for measuring nm-scale tip-sample capacitance14 Apr 2005US 2005/0077915 A1The Ohio State University
- Electrical scanning probe microscope apparatus10 Feb 2005US 2005/0030054 A1National Applied Research Labratories
- Method of measuring electrical capacitance10 Jun 2004US 2004/0108864 A1Sharp Kabushiki Kaisha
- Direct, low frequency capacitance measurement for scanning capacitance microscopy15 Jan 2004US 2004/0008042 A1The Ohio State University
Most cited
By later US patents
- Scanning capacitance microscope39US 4,481,616 ARCA Corporation · 1984
- Information processing apparatus with mechanism for adjusting interval between substrate for supporting a plurality of probes and recording medium35US 5,717,680 ACanon Kabushiki Kaisha · 1998
- Capacitance atomic force microscopes and methods of operating such microscopes19US 6,172,506 B2Veeco Instruments Inc. · 2001
- Quantitative two-dimensional dopant profile measurement and inverse modeling by scanning capacitance microscopy17US 5,523,700 AUniversity of Utah Research Foundation · 1996
- Electrical scanning probe microscope apparatus15US 6,975,129 B2National Applied Research Labratories · 2005