Y10S 977/861
Scanning tunneling probe
Y10S977/861 (Scanning tunneling probe) appears on 169 US grants and 13 published applications in this corpus.
Search patents in Y10S- Granted patents
- 169
- Published applications
- 13
- Assignees
- 61
- Inventors
- 264
- Latest grant
- 18 Nov 2014
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 7 | 0 |
| 1990 | 9 | 0 |
| 1991 | 12 | 0 |
| 1992 | 16 | 0 |
| 1993 | 22 | 0 |
| 1994 | 21 | 0 |
| 1995 | 15 | 0 |
| 1996 | 18 | 0 |
| 1997 | 5 | 0 |
| 1998 | 12 | 0 |
| 1999 | 4 | 0 |
| 2000 | 2 | 0 |
| 2001 | 8 | 5 |
| 2002 | 3 | 3 |
| 2003 | 3 | 0 |
| 2004 | 4 | 0 |
| 2005 | 0 | 0 |
| 2006 | 0 | 2 |
| 2007 | 0 | 1 |
| 2008 | 4 | 1 |
| 2009 | 1 | 0 |
| 2010 | 0 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 1 |
| 2013 | 0 | 0 |
| 2014 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Scanning tunneling microscope assembly, reactor, and system18 Nov 2014US 8,893,309 B2The Regents of the University of California
- Semiconductor probe having resistive tip with low aspect ratio and method of fabricating the same5 May 2009US 7,528,371 B2Samsung Electronics Co., Ltd.
- Spin-polarized electron source and spin-polarized scanning tunneling microscope2 Dec 2008US 7,459,682 B2Hon Hai Precision Industry Co., Ltd.
- Scanning probe characterization of surfaces2 Sep 2008US 7,420,106 B2University of Utah Research Foundation
- Cryogenic variable temperature vacuum scanning tunneling microscope19 Aug 2008US 7,414,250 B1Northwestern University
- Scanning Tunneling Microscope Assembly, Reactor, and System27 Sep 2012US 2012/0244038 A1The Regents of the University of California
- Spin-polarized electron source and spin-polarized scanning tunneling microscope27 Mar 2008US 2008/0073554 A1Hon Hai Precision Industry Co., Ltd.
- Semiconductor probe having resistive tip with low aspect ratio and method of fabricating the same22 Feb 2007US 2007/0040116 A1Samsung Electronics Co., Ltd.
- Probe of scanning probe microscope having a field effect transistor channel and fabrication method thereof12 Oct 2006US 2006/0230475 A1Postech Foundation
- Scanning probe characterization of surfaces5 Oct 2006US 2006/0225164 A1University of Utah
Most cited
By later US patents
- Scanning tunneling microscope200US 4,343,993 AInternational Business Machines Corporation · 1982
- Ultra-high density storage device149US 5,557,596 A1996
- Integrated scanning tunneling microscope137US 4,906,840 AThe Board of Trustees of the Leland Stanford Jr. University · 1990
- Jumping probe microscope123US 5,266,801 ADigital Instruments, Inc. · 1993
- Molecular memory medium and molecular memory disk drive for storing information using a tunnelling probe118US 5,453,970 A1995