H04N 25/715
Using frame interline transfer [fit]
Official title: using frame interline transfer [FIT]
H04N25/715 (Using frame interline transfer [fit]) appears on 83 US grants and 31 published applications in this corpus.
Search patents in H04N- Granted patents
- 83
- Published applications
- 31
- Assignees
- 40
- Inventors
- 142
- Latest grant
- 1 Sep 2020
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 3 | 0 |
| 1987 | 1 | 0 |
| 1988 | 3 | 0 |
| 1989 | 5 | 0 |
| 1990 | 3 | 0 |
| 1991 | 3 | 0 |
| 1992 | 5 | 0 |
| 1993 | 4 | 0 |
| 1994 | 5 | 0 |
| 1995 | 7 | 0 |
| 1996 | 2 | 0 |
| 1997 | 2 | 0 |
| 1998 | 5 | 0 |
| 1999 | 3 | 0 |
| 2000 | 2 | 0 |
| 2001 | 0 | 3 |
| 2002 | 1 | 1 |
| 2003 | 0 | 0 |
| 2004 | 0 | 2 |
| 2005 | 1 | 1 |
| 2006 | 1 | 2 |
| 2007 | 0 | 2 |
| 2008 | 2 | 4 |
| 2009 | 3 | 4 |
| 2010 | 2 | 3 |
| 2011 | 4 | 2 |
| 2012 | 5 | 0 |
| 2013 | 1 | 1 |
| 2014 | 1 | 1 |
| 2015 | 0 | 0 |
| 2016 | 2 | 1 |
| 2017 | 0 | 2 |
| 2018 | 2 | 1 |
| 2019 | 2 | 1 |
| 2020 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Dual-column-parallel CCD sensor and inspection systems using a sensor1 Sep 2020US 10,764,527 B2KLA-Tencor Corporation
- Dual-column-parallel CCD sensor and inspection systems using a sensor4 Jun 2019US 10,313,622 B2KLA-Tencor Corporation
- Sensor with electrically controllable aperture for inspection and metrology systems29 Jan 2019US 10,194,108 B2KLA-Tencor Corporation
- Multimode photosensor22 May 2018US 9,979,905 B2Microsoft Technology Licensing, LLC
- Sensor with electrically controllable aperture for inspection and metrology systems2 Jan 2018US 9,860,466 B2KLA-Tencor Corporation
- Dual-Column-Parallel CCD Sensor And Inspection Systems Using A Sensor15 Aug 2019US 2019/0253652 A1KLA-Tencor Corporation
- Sensor With Electrically Controllable Aperture For Inspection And Metrology Systems8 Mar 2018US 2018/0070040 A1KLA-Tencor Corporation
- Dual-Column-Parallel CCD Sensor And Inspection Systems Using A Sensor12 Oct 2017US 2017/0295334 A1KLA-Tencor Corporation
- Multimode photosensor18 May 2017US 2017/0142353 A1Microsoft Technology Licensing, LLC
- Sensor With Electrically Controllable Aperture For Inspection And Metrology Systems17 Nov 2016US 2016/0334342 A1KLA-Tencor Corporation
Most cited
By later US patents
- Exposure control system for an electronic imaging camera having increased dynamic range152US 4,647,975 APolaroid Corporation · 1987
- Solid-state imaging device having high-speed shutter function43US 4,839,734 AKabushiki Kaisha Toshiba · 1989
- Position-stabilized image converter system38US 4,717,958 AElbit Computers Ltd. · 1988
- Smear and/or blooming in a solid state charge transfer image pickup device35US 4,322,753 ANippon Electric Co., Ltd. · 1982
- Solid-state imaging device having high-speed shutter function and method of realizing high-speed function in solid-state imaging device35US 4,831,453 AKabushiki Kaisha Toshiba · 1989